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  • 1995-1999  (2)
  • 1975-1979  (2)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 33 (1977), S. 618-621 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A dynamical theory of electron diffraction, based on the Howie-Whelan equations and generalized to the non-centrosymmetric case, has been used successfully to determine the absolute configuration of the structure in ordered lithium ferrite (LiFe5O8) crystals. The ability to distinguish between the P4132 and P4332 space groups on a very fine scale has been demonstrated.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 31 (1975), S. 70-76 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Simple electron-microscopy techniques are described which allow one to detect the presence of two enantiomorphous forms of a structure within an apparent single crystal. The first method consists of a characterization of the interface between the two enantiomorphs. In the second method advantage is taken of violations of Friedel's law which can occur in non-centrosymmetric crystals. These techniques have been illustrated by an analysis of the domain structure in ordered LiFe5O8, which has a space group P4132 or P4332. Consistent results were obtained with both methods. The first method yields a more complete description of the domain structure. Methods which can be used to determine the absolute configuration of the structure in a part of the crystal are discussed.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 34 (1999), S. 5513-5517 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Gradual damage development in carbon fibre-reinforced polymers (CFRP) and its effect on the mechanical properties have been important subjects of investigation for many years. Most authors have studied transverse matrix cracking in cross-ply lay-ups and used the longitudinal Young's modulus as an indicator of the extent of damage development. Reductions of typically only a few percent have been found at saturation crack spacing. Some authors have studied the effect of matrix cracking on Poisson's ratio. The results show large reductions, but few data are available on the evolution of Poisson's ratio throughout the process of gradual matrix cracking and on the influence of the 0°/90° ply thickness ratio. Moreover, none of the available models seems to accurately predict the quantitative evolution of Poisson's ratio. In this work the degradation of the longitudinal and the transverse properties of a number of cross-ply CFRP laminates due to transverse matrix cracking under longitudinal tension was studied. The longitudinal Young's modulus appeared to be less sensitive to damage development, in contrast to Poisson's ratio which exhibited significant reductions in all lay-ups. A micromechanical model, based on the shear lag theory, was developed to predict the evolution of Poisson's ratio and the effect of the 0°/90° ply thickness ratio. The correlation between experiment and theory was very satisfactory.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 17 (1998), S. 1453-1455 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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