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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 213-215 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A reliable procedure for controlled vertical transfer of single CO molecules between a Cu(111) surface and a scanning tunneling microscope tip and vice versa is demonstrated. It is shown that with a tip having a single CO molecule at its apex, chemical contrast is achieved allowing distinction of adsorbed CO molecules and oxgen atoms, which look very similar to the bare metal tip. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1677-1680 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The BW1 x-ray undulator beamline at HASYLAB offers high intensity for a wide variety of diffraction and absorption experiments. The x-ray undulator is a 4-m-long device with 127 periods. At 4.5 GeV energy of the positron storage ring DORIS III it can be tuned in its 3rd harmonic to photon energies from 9 to 15 keV. The basis for such a beamline is a high precision monochromator which has to be able to cope with high heat loads from the insertion device. There are four operating modes: (i) focused white beam using two mirrors with a cutoff energy of approximately 11 keV, (ii) focused monochromatic beam using both mirrors with a cutoff energy of ≈12 keV and a double-crystal monochromator, (iii) unfocused monochromatic beam using the monochromator without mirrors, and (iv) focused monochromatic beam using the monochromator without mirrors but with a sagittally focusing second crystal. Currently, a horizontal diffractometer for the investigation of liquid surfaces, an ultrahigh vacuum chamber for standing wave measurements and a versatile x-ray multicircle diffractometer are installed in the experiment hutch. Typical scientific investigations performed at this beamline will be discussed to demonstrate the capabilities of the whole setup. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 2185-2187 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The step topography of 4°-misoriented Si(001) surfaces was examined by scanning tunneling microscopy and spot profile analyzing–low-energy electron diffraction. The clean Si(001)-(2×1) surface proves to be a single domain substrate, which is characterized by a regular array of double steps. This step structure is changed dramatically upon adsorption of submonolayer quantities of Ag at ∼700 K. In this case, the formation of multisteps with fourfold, sixfold, and eightfold step heights occurs. The single domain character of the substrate is preserved, now showing a Ag-induced (3×2) reconstruction. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 538-540 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A scanning near-field optical microscope is combined with a modified Sagnac interferometer to generate high-resolution magnetic contrast images of a magneto-optical disk (MOD) in reflection. The interferometer acts as a magnetic sensor to determine the Kerr rotation of reflected circularly polarized light. A separate shear-force sample topography is obtained simultaneously with the optical. This technique allows successful magnetic imaging of samples with complicated surface topographies, as demonstrated with the MOD. For these initial measurements, the resolution with nonmetal-coated fiber tips is 300 nm, and the magnetic phase sensitivity is 1 mrad. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 183 (1965), S. 412-423 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract For diffusion layers of Nb3Sn, V3Ga, and V3Si on niobium and vanadium wires, respectively, the transition to superconductivity has been measured at various currents in longitudinal and transverse magnetic fields. Current and field shift the transition curve to lower temperatures, except near the onset of superconductivity where the core of the wire influences the transition. The critical current vs. temperature curves are linear at higher currents, the critical field curves are bended. The results are explained by local variations of the transition temperature due to inhomogeneities and by a displacement of the current paths under the influence of the Lorentz force. For very thin diffusion layers an influence of thickness on the transition temperature has been observed. In addition quenching curves of the diffusion layers have been measured. The shape is in accordance with the model ofKim and coworkers. The absolute values and deviations at higher fields are discussed. A deduction of the critical values at low temperatures from measurements near the transition is possible.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 189 (1966), S. 191-198 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract For samples of the system Nb-Sn sintered between 700 and 1500°C with 20 and 25 percent Sn the inductive and resistive transition to superconductivity has been measured. Especially the influence of magnetic fields on the transition has been examined. The inductive transition is deduced from shielding currents, the anomalous rise of the transition temperature for the 4Nb∶1Sn-samples first found byJansen turns out to be a consequence of higher critical currents of these samples. At low sintering temperatures a rise of the critical fields has been observed.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 189 (1966), S. 199-206 
    ISSN: 1434-601X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The temperature variation of the initial suszeptibility has been measured for bulk sintered and diffusion samples as well as for finely ground sintered and melted samples of superconducting Nb3Sn, Nb3Al, and V3Si. Penetration effects must be accounted for the width of the inductive transition curve if the interior of the sample is not completely shielded by current loops. Absolute values of the penetration depths after extrapolating to zero temperature were estimated to (0,18±0,04) μ for Nb3Sn, (0,19±0,04) μ for Nb3Al, and (0,27±0,05) μ for V3Si. The transition temperature obtained by suszeptibility measurements is lowered with decreasing grain size.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1434-601X
    Keywords: 25.20.−x ; 25.20.Lj ; 27.40.+z
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The values of the angle-integrated cross section for the decay to various low-lying states in39K following the40Ca(γ,π) reaction at a mean photon energy of 60 MeV are reported on, together with the values of the reduced Legendre coefficientsa i . The40Ca(γ,gp) and40Ca(γ,n) reactions yield the same angular cross-section values and these agree with the corresponding RPA-calculations.
    Type of Medium: Electronic Resource
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  • 9
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    Unknown
    New York, N.Y. : Periodicals Archive Online (PAO)
    Harper's. 291:1742 (1995) 37 
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  • 10
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 315-317 (July 1999), p. 154-162 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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