ISSN:
1432-0630
Keywords:
42.80
;
72.15
;
78.65
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract A Photon Scanning Tunneling Microscope (PSTM) with probe-sample distance control by electron tunneling is used to probe the localized surface-plasmon fields of individual nanometric silver particles. As samples, conventional island films produced by thermal evaporation and regular particle arrays produced by an electron-beam-lithography-based technique, respectively, are used. In either case the strength and spatial localization of the surface-plasmon fields strongly depend on the excitation wavelength. The results are interpreted as different resonance frequencies of individual particles or of different sample areas. On regular arrays consisting of particles with a smallest diameter of 40 nm, the PSTM maps represent the plasmon field strength spatially resolved for individual particles.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01540256
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