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  • 1995-1999  (2)
  • 61.80  (1)
  • 81.60  (1)
  • PACS: 61.80.Jh; 73.25  (1)
  • 1
    ISSN: 1432-0630
    Keywords: 61.40 ; 61.80 ; 66.30 ; 81.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Li salts of acrylic acid were grafted to polyethylene, PE. It is known that li is mobile in this material at room temperature, and hence can act as a probe for newly introduced defects. After irradiation of PE(Li) with 100 keV He+ ions at different fluences the Li depth distributions were measured by NDP. Changes in the Li distributions are observed which are ascribed to bonding at oxygen, the latter one preferentially penetrating into the PE via the irradiation-damaged sample surface. With increasing sample age, i.e. after exposure to ambient atmosphere for more than half a year, Li appears to lose its original mobility.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    ISSN: 1432-0630
    Keywords: PACS: 61.80.Jh; 73.25
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  Silicon wafers were implanted with 40 keV B+ ions and then with 50 keV N+ or 100 keV Ar+ ions to doses from 1.2×1014 to 1.2×1015 cm-2. The implanted samples were studied using the Hall effect and standard van der Pauw methods. The dependences of the sheet resistivity and the sheet concentration of charge carriers on the annealing temperature in the range from 700 to 1300 K were obtained. Models describing the influence of additional implantation of nitrogen and argon ions on the process of boron electrical activation during annealing are proposed.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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