ISSN:
1434-6036
Keywords:
68.15
;
61.10
;
68.10
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract X-ray scattering experiments of liquid films on top of solid substrates were performed. With a short pulse disturbance, caused by a temperature difference between the substrate and the vapour in the X-ray cell, the wetting film thickness is reduced. Afterwards the time dependence of the growing film is monitored by X-ray reflectivity measurements in the region of total external reflection. We have examined CCl4- and CCl3Br-films on top of silicon wafers and CCl3Br on glass/gold and glass/silver substrates. The film thickness as function of time is explained by the Kolmogorov growth model. From the data we obtain rather long time constants and the dimensiond=2 of the growing process
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01318283
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