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  • 1
    ISSN: 0021-9304
    Keywords: collagen fibrils ; apatitic crystals ; orientation ; X-ray diffraction ; polarized optical microscopy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Medicine , Technology
    Notes: X-ray diffraction and polarized optical microscopy investigations were carried out on thin sections of rabbit tibia in order to study the morphological organization of the structural components of this tissue, which often is utilized to test bone response to implants. In the optical microscope, the lateral face as well as the lateral portion of the caudal face exhibit a lamellar structure with an alternation of dark and bright lamellae running parallel to the long axis of the tibia. In contrast, both in the medial face and in the medial portion of the caudal face there are numerous osteonic structures. In spite of the complexity of this morphological organization, the results of small- and high-angle X-ray diffraction analyses indicate that the structural relationship between collagen fibrils and inorganic crystals is quite similar to that observed in single osteons and allows evaluation of the orientation of the two main structural components. Both collagen fibrils and apatitic crystallites are preferentially oriented parallel to the long axis of the tibia. The degree of orientation is greater in the thickness than in the plane of the lamellae, suggesting that collagen fibrils and inorganic crystallites lie preferentially in the plane of the lamellae, where they follow an oblique course. The degree of orientation of the apatitic crystallites is higher in the lateral face than in the medial and caudal faces, in agreement with the optical microscopic images. The results provide information that must be taken into account when evaluating the structural modifications of bone due to the insertion of a prosthetic device. © 1998 John Wiley & Sons, Inc. J Biomed Mater Res, 41, 289-295, 1998.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 675-678 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The growth process of ZnO films on Si(100) by single-source chemical vapour deposition (CVD) was investigated. During the initial stages of growth (film thickness 〈30Å), oxidation of the Si substrate was observed which resulted in an interfacial region consisting of ZnO and Si oxides. For film thicknesses in excess of 40 Å the composition of the film approaches that of a continuous ZnO film. It is suggested that the mixed interfacial region strongly influences the adhesion of the film on the substrate by providing Zn-O-Si-type bonds. The oxidation of the substrate during the initial film growth may have direct implications on the type of contact layers that can be used in ZnO thin-film devices using single-source CVD techniques.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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