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  • 1
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Novel EPDM (ethylenepropylenediene monomer) and polybutadiene polyols can be synthesized by a two-step process of controlled hydroformylation and then reduction of the formyl groups to place a desired amount of pendant alcohol groups along the polymer chain. The degree of functionalization can be controlled by measuring gas uptake from a calibrated reservoir during hydroformylation. Hydroformylation can be performed in solution or under simulated melt-phase conditions using either HRh(CO)(PPh3)3 or Rh(acac) (CO)2 as catalysts. Reduction of the polyaldehyde by NaBH4 generates the polymeric alcohol without further reaction of the remaining double bonds. Polymer functionalization and further modifications were followed by H-NMR and FTIR. These unique hydrophobic polyols can be reacted further to produce other polymer systems. As an example, urethanes have been made with these polyols by reaction with diisocyanates. © 1995 John Wiley & Sons, Inc.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Thin films of TiNx with 0.34〈x〈1.19 were deposited on silicon substrates by a filtered arc deposition process. Spectroscopic ellipsometry (SE) in the energy region 1.5-3.5 eV was used to measure the optical properties of the films. X-ray photoelectron spectroscopy (XPS) was used to determine the relative atomic concentration and the chemical states of the elements. The dielectric function ε(ω) measured by ellipsometry gives the optical response of TiNx films and valuable information on their chemical composition, which is also verified by XPS. The plasma energy ωp of TiNx films was found to depend strongly on the N/Ti ratio and this is correlated with the value of x as determined by XPS and Rutherford backscattering spectroscopy (RBS). The results show that, via the calibration, spectroscopic ellipsometry may be used to estimate the stoichiometry of deposited TiNx films.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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