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  • 1995-1999  (2)
  • bcl-2 gene  (1)
  • nondestructive testing  (1)
  • 1
    ISSN: 1437-160X
    Keywords: SLE ; Apoptosis ; bcl-2 gene ; Susceptibility ; Linkage ; Genetics
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Systemic lupus erythematosus (SLE) is an autoimmune disease characterised by the production of a large number of autoantibodies. It has been postulated that this may be the result of prolonged longevity of auto-reactive B cells due to defective regulation of programmed cell death (apoptosis). The proto-oncogenebcl-2 is involved in the control of apoptosis in immunocompetent cells, and its over-expression is noted in T and B cells from SLE patients. This study examined the genetic linkage between thebcl-2 gene locus and SLE susceptibility using the affected sib-pair method in SLE families. Seventeen caucasian multiplex families were evaluated. A polymorphic microsatellite marker closely linked to thebcl-2 gene on 18g21.3 was used to determine thebcl-2 genotype. We demonstrated that haplotype sharing among the affected sibling pairs was not statistically different from random (P〉0.5). This suggests that thebcl-2 gene locus does not confer a genetic susceptibility to SLE expression.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Experimental mechanics 36 (1996), S. 71-77 
    ISSN: 1741-2765
    Keywords: holography ; interferometry ; nondestructive testing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Substrate guided wave (SGW) holograms are recorded and reconstructed using light waves guided through an optical substrate. The recording geometries for producing transmission and reflection SGW holograms are discussed. Practical guidelines are presented for recording and reconstructing interferograms suitable for nondestructive testing.
    Type of Medium: Electronic Resource
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