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  • 1
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Clinical and experimental dermatology 20 (1995), S. 0 
    ISSN: 1365-2230
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: Pemphigoid gestationis (PG) is a rare, autoimmune skin disease associated with pregnancy or the immediate postpartum period, previously shown to be associated with the HLA class II antigens DR3 and DR 4. Advances in molecular analytical techniques now allow the identification of HLA alleles previously difficult to define by serological assays. Unsuspected polymorphism within the HLA-DR 3 and DR 4 classes can, therefore, be identified. The aim of our study was to apply these newer techniques to the question of genetic predisposition in PG by re-evaluating the association with DR 3 and by studying a possible link with DQ. We have investigated by restriction fragment length polymorphism, the DQA, and by sequence specified oligonucleotide probing the DQB and DRB 1 (HLA DR) specificities of 41 women with immunofluorescence-confirmed PG. The principal finding of this study is that there is an association between PG and DRB 1*0301 (DR3) and DRB 1*0401/040X (DR4). Although there is also an increase (P= 0.06) in the concurrent presence of both antigens, this appears to be due to the association with either antigen alone. We also found an increase in the frequency of DQA1*2 (P= 0.016 vs. control) and a decrease in frequency of DQB 1*0201 (P= 0.022 vs. controls) and DQB1*0602 (P= 0.026 vs. controls).
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [s.l.] : Nature Publishing Group
    Nature 381 (1996), S. 30-31 
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] SIR - The Tertiary limestones of River-sleigh (northwest Queensland) have yielded an assemblage of beetles (including larvae), flies and millipedes preserved in three dimensions, in addition to the already diverse range of vertebrates so far reported1. These arthropods were recovered from the Upper ...
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Environmental monitoring and assessment 50 (1998), S. 37-51 
    ISSN: 1573-2959
    Keywords: nitrogen dioxide ; passive sampler ; small area variation ; urban air
    Source: Springer Online Journal Archives 1860-2000
    Topics: Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Two-week average NO2 concentrations were measured in Amsterdam (NL), Huddersfield (UK) and Prague (CZ) at 80 sites in each study area, to assess small area spatial variation, using a tube type and a badge type passive sampler. The badges appeared to be less robust than the tubes. The lower detection limit for tubes and badges was 3.7 and 0.91 µg/m3, respectively for fortnightly measurements. Accuracy of the samplers was determined with reference methods (chemiluminescence). The mean ratio of the concentration measured by diffusion tube over that by the reference method was 1.16, 1.03 and 0.77 in Amsterdam, Huddersfield and Prague, respectively. Standardizing the badges for the results obtained in Amsterdam, the relative mean ratio of the concentration measured by the badges over that by the reference method was 0.95 and 0.58 in Huddersfield and Prague, respectively. NO2 concentrations measured by the two designs did not differ significantly. Mean NO2 concentrations were 36, 26 and 22 µg/m3 in Amsterdam, Huddersfield and Prague, respectively. The precision of duplicate tubes and badges was 8% and 11%, respectively. Both samplers are suitable for determining real variation in small area NO2 concentrations in the ranges which occurred. It is concluded that low-cost, simple NO2 passive samplers can provide reliable information about variation in NO2 concentrations within urban or rural areas on a small spatial scale. Based on its robustness and its precision, tubes were preferred over badges.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 343-351 
    ISSN: 0142-2421
    Keywords: poly(vinyl alcohol) thin films ; x-ray degradation ; substrate effects ; x-ray intensity dependence ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Films of poly(vinyl alcohol), ∽2 nm thick, on silicon, copper and gold substrates were allowed to degrade for up to 800 min during monochromatized Al Kα XPS. Relative initial degradation rates of 1:∽33:∽41 were measured for the three substrates, consistent with their yield of photoelectrons and secondary electrons. The initial rate of degradation was found to vary linearly with the x-ray intensity. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In the present interlaboratory comparison, the consistency and validity of the Shirley, straight-line and Tougaard methods for determination of peak intensities from measured XPS spectra have been studied by analysis of data on Au and Ni taken at eight laboratories. The reproducibility of the individual measuring systems was determined to be 2-6%. The RMS scatter around their mean values of the ratio of the peak intensity to the Au 4d peak intensity was 6% for the Tougaard method, 9-10% for the Shirley method and 8-9% for the straight-line method. The increase in root mean square (RMS) scatter of data due to data being recorded in different laboratories amounts to 3-4%, independent of the method applied for background correction. The RMS deviation from theory of intensity ratios of peaks from Ni and Au to the Au 4d peak intensity is 14% for the Tougaard method, 33% for the Shirley method and 31% for the straight-line method. The absolute accuracy of the methods cannot be established to better than the accuracy on the theoretical peak intensity ratios and the uncertainty in the energy dependence of the analyser response function. It is, however, reasonable to expect the combined uncertainty of these factors to be at least 10-15%. The peak intensity ratios obtained with the Tougaard method then falls within the expected accuracy of the theoretical ratios.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 419-421 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) studies, utilizing both laterial imaging and shallow depth profiling, of a 50:50 poly(vinyl chloride)/poly(methyl methacrylate) (PVC:PMMA) blend have confirmed the presence of a thin overlayer of PMMA on the phase-separated bulk morphology.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 261-274 
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; PMMA ; molecular weight effect ; relative ion intensities ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: This paper is concerned with the effects that polymer molecular weight, casting solvent, sonification (with a non-polymer solvent) and annealing have upon the secondary ion mass spectrometry (SIMS) of polymers.Films of a series of monodispersed poly(methyl methacrylate) (PMMA) standards, Mw 2965-1200000, were prepared by solution casting from four solvents (tetrahydrofuran (THF), 2-butanone, toulene and chloroform) onto clean aluminium (Al) substrates. The PMMA films were characterized by high- and unit-mass resolution time-of-flight secondary ion mass spectrometry (ToF-SIMS). To determine the significance of variations seen in ion intensities, one PMMA sample was re-analysed 24 times, and the scatter in the absolute counts and normalized and ratioed ion intensities for specific (termed ‘key’) positive and negative ions were calculated. This provided 95% confidence error bars, which were subsequently employed. The 95% confidence limits were significantly reduced by normalizing or ratioing.Molecular weight was found to have the greatest effect in the SIMS spectra obtained, with the differences being most marked between Mw=2965 and Mw=89100. This was seen in both the total negative ion counts (m/z 31-200) and the key negative ion ratios. An explanation based on the surface concentration of chain ends is presented. Negative ion ratios were shown to be very sensitive to trace amounts of residual solvents. By annealing above the PMMA glass transition temperature Tg solvent-free films were produced from three solvents and these were spectrally indistinguishable. Solvent-free films could not be produced from THF. Residual solvent was identified by high mass resolution ToF-SIMS. Sonification with hexane, a polymer non-solvent, had a considerable effect on the total negative ion counts (m/z 31-200). No concomitant chemical changes were detected, so this effect is thought to arise from a physical perturbation of the surface. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 19 Ill.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; high mass resolution ; quantification ; methacrylate copolymers ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A previous XPS and low mass resolution (quadrupole) SIMS study of methyl methacrylate-poly(ethylene glycol) methacrylate random copolymers indicated (by XPS) a surface composition close to that of the bulk, however the trends in SIMS intensity ratios for peaks chosen to represent the individual monomers showed departures from linearity that were not understood. High mass resolution time-of-flight (ToF) SIMS data has shed light on the earlier results and, as a result, linear correlations have been established. In addition it has been possible to study high mass fragments derived from the poly(ethylene glycol) side chain. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 167-176 
    ISSN: 0142-2421
    Keywords: ToF-SIMS ; ion beam damage ; poly(vinyl chloride) ; poly(methyl methacrylate) ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Changes in the SIMS spectra of poly(vinyl chloride) (PVC) and poly(methyl methacrylate) (PMMA) as a function of 8 keV Cs+ dose have been studied in the range 1011-5×1013 ions cm-2. In order to resolve uncertainties in previous studies (based on quadrupole SIMS and insulating samples) this work has utilized a high mass resolution ToF-SIMS instrument and films on silicon sufficiently thin to obviate the need for surface potential control (charge neutralization). The form of the damage curves has been compared with a recently introduced model of damage development based on the statistics of bond breaking. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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