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  • 1
    Electronic Resource
    Electronic Resource
    Contribution of the x-ray absorption spectroscopy to study TiO2 thin films prepared by ion beam induced chemical vapor deposition (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 591-597 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: TiO2 thin films have been prepared and their structure analyzed by XRD at grazing angles and x-ray absorption spectroscopies (EXAFS/XANES). The deposition method is an ion beam induced chemical vapor deposition procedure (IBICVD) consisting of the bombardment of a substrate with accelerated O+2 ions while the vapor of a volatile metallic precursor is directed on its surface. The structure of the films was dependent on the type of substrate (glass, fused quartz, and sapphire) and on the conditions used for their preparation (temperature of substrate and beam energy of 1 or 10 keV). Thus, while on glass and silica/sapphire, an amorphous structure is formed when the substrate is at 300 K during preparation, a rutile-rich structure is obtained if the substrate is at 573 K during deposition or, even to a larger degree, when using ions of 10 keV. The amorphous structure of the films grown on glass yield 100% anatase after calcining at 773 K. On sapphire, the crystallization was less perfect and besides anatase, rutile and amorphous phases were detected after calcination at that temperature. The films prepared at 573 K or with O+2 ions of 10 keV yield after calcining a well ordered structure of rutile. A detailed analysis of the EXAFS and XANES spectra has permitted a better characterization of the amorphous and crystalline phases in the films and provided a better understanding of the crystallization processes during calcination. The contribution of the different factors controlling the crystallization of the films is discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359043
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  • 2
    Electronic Resource
    Electronic Resource
    Spectroscopic Characterization of Quantum-Sized TiO2 Supported on Silica: Influence of Size and TiO2-SiO2 Interface Composition (1995)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 99 (1995), S. 1484-1490 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100005a019
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  • 3
    Electronic Resource
    Electronic Resource
    In Situ EXAFS Study of the Photocatalytic Reduction and Deposition of Gold on Colloidal Titania (1995)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 99 (1995), S. 3303-3309 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100010a047
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  • 4
    Electronic Resource
    Electronic Resource
    Diffraction and XPS Studies of Misfit Layer Chalcogenides Intercalated with Cobaltocene (1995)
    s.l. : American Chemical Society
    Chemistry of materials 7 (1995), S. 1576-1582 
    Details
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/cm00056a026
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  • 5
    Electronic Resource
    Electronic Resource
    Chemical effects in TiO2 and titanates due to bombardment with Ar+ and O 2 + ions of different energies (3.5-10 keV) (1996)
    Springer
    Applied physics 63 (1996), S. 237-242 
    Details
    ISSN: 1432-0630
    Keywords: 61.80 jh ; 82.80.pv ; 81.60.dq
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Compositional and chemical changes in TiO2 and Ph, Ni, Al and Ba titanates induced by bombardment with Ar+ and O 2 + ons of different energies have been studied quantitatively by XPS. An increase of preferential loss of oxygen and, in case of PbTiO3, of lead has been observed when increasing the Ar+ ion energy from 3.5 to 10 keV. Because of oxygen loss, Ti4+ species reduce to Ti3+ and Ti2+. In addition, the loss of oxygen from PbTiO3 and NiTiO3 leads to the metallic state of nickel and lead, whereas aluminium and barium in Al2TiO5 and BaTiO3 maintain their chemical state (i.e., Al3+ and Ba2+). Bombardment with OZ ions of PbTiO3 and NiTiO3 leads to a partial reduction of Pb and Ni. This metallization and the preferential loss of lead are more efficient at higher ion energies for both, O 2 + and Ar+ bombardment. The results are discussed in terms of chemical stabilities and the possibility of oxygen diffusion in the bombarded oxides.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01567875
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  • 6
    Electronic Resource
    Electronic Resource
    Chemical effects in TiO2 and titanates due to bombardment with Ar+ and O+2 ions of different energies (3.5–10 keV) (1996)
    Springer
    Applied physics 63 (1996), S. 237-242 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 61.80.jh; 82.80.pv; 81.60.dq
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  Compositional and chemical changes in TiO2 and Pb, Ni, Al and Ba titanates induced by bombardment with Ar+ and O+ 2 ions of different energies have been studied quantitatively by XPS. An increase of preferential loss of oxygen and, in case of PbTiO3, of lead has been observed when increasing the Ar+ ion energy from 3.5 to 10 keV. Because of oxygen loss, Ti4+ species reduce to Ti3+ and Ti2+. In addition, the loss of oxygen from PbTiO3 and NiTiO3 leads to the metallic state of nickel and lead, whereas aluminium and barium in Al2TiO5 and BaTiO3 maintain their chemical state (i.e., Al3+ and Ba2+). Bombardment with O+ 2 ions of PbTiO3 and NiTiO3 leads to a partial reduction of Pb and Ni. This metallization and the preferential loss of lead are more efficient at higher ion energies for both, O+ 2 and Ar+ bombardment. The results are discussed in terms of chemical stabilities and the possibility of oxygen diffusion in the bombarded oxides.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01567875
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  • 7
    Electronic Resource
    Electronic Resource
    Thermal and photochemical methods for the preparation of thin films of cermet materials (1996)
    Springer
    Journal of materials science 31 (1996), S. 2325-2332 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The synthesis of thin films of Ag-SiO2, Ag-TiO2 and Ag-TiO2-SiO2 cermet materials is described. The preparation method consists in a sol-gel process based in the dip-coating technique to obtain thin films of a composite material containing the oxidized metal and the corresponding ceramic material (TiO2 and/or SiO2). The films, prepared on quartz, were finally heated or irradiated to induce the reduction of the metal and the formation of the cermet materials. An exhaustive characterization of the samples has been carried out by scanning electron microscopy, X-ray diffraction, transmission electron microscopy, and Rutherford backscattering. The optical properties of the prepared thin films were determined by UV-VIS absorption spectroscopy and related to the microstructural characteristics of the cermet. Conclusions have been postulated to relate the experimental conditions of the synthesis (thermal or photochemical) to the microstructure and properties of the resulting materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01152941
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  • 8
    Electronic Resource
    Electronic Resource
    Control of the stoichiometry in the deposition of cobalt oxides on SiO2 (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 62-71 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; ISS ; CoO ; Co3O4 ; interface effects ; cobalt oxide ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Both CoO and Co3O4 overlayers have been deposited on SiO2 by evaporation from metallic Co and subsequent oxidation with oxygen and a plasma of oxygen. The combined use of ion scattering spectroscopy and XPS shows that both oxides grow in the form of small particles on the surface of SiO2. Ion scattering spectroscopy also shows that the surface of cobalt oxide exposed to a plasma of oxygen is enriched in oxygen ions with respect to the surface of the cobalt oxide formed by exposure to oxygen. The Co 2p spectra corresponding to the deposits obtained by oxidation with O2 are characteristic of CoO, while those corresponding to the deposits obtained after oxidation with a plasma are typical of Co3O4. Moreover, the OCo/Co ratios determined by XPS and factor analysis indicate the formation of CoO stoichiometry in the former case and Co3O4 stoichiometry in the latter. It has also been observed that no shift in either binding energy or modified Auger parameter α′ appears as a function of coverage. This absence of shifts is interpreted as a consequence of the type of screening mechanism that dominates the relaxation of the photoholes in these oxides. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO2 Catalysts (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 292-294 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; Auger parameter ; TiO2 ; catalyst ; chemical state plot ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The analysis by XPS of TiO2 deposited on different substrates (SiO2, MgO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is possible with a chemical state plot. The implications of the existence of such shifts for the characterization of catalysts are discussed. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Oxidation of molybdenum surfaces by reactive oxygen plasma and O2+ bombardment: an auger and XPS study (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 235-241 
    Details
    ISSN: 0142-2421
    Keywords: molybdenum oxides ; oxygen plasma ; ballistic effects ; XPS ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The oxidation of molybdenum at room temperature with oxygen plasma or a beam of O2+ ions has been studied with Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS). Auger electron spectroscopy shows a progressive modification of the N2,3VV lineshape and the development of new features close to the intense M4,5NN Auger transitions of metallic Mo at 160, 186 and 221 eV. The effects are greater with the oxygen plasma than with the O2+ bombardment. X-ray photoelectron spectroscopy shows that the incorporation of oxygen into the molybdenum gives rise to the formation of Mo6+, Mo4+ and a form of Mon+ (n〈4). The (Mo4++Mon+)/Mo6+ ratio was higher after O2+ ion bombardment than by treatment with the oxygen plasma, in which case the concentration of the Mo4+ and Mo6+ oxidation states was very similar. The analysis of the O 1s and O KLL Auger spectra under the different conditions showed that whenever a high concentration of the Mo6+ species is present, the O-Mo bond is more covalent in character. To evaluate the influence of chemical and ballistic effects in the two oxidation processes, additional experiments were carried out with MoO3. This oxide was bombarded with Ar+ and O2+ until a steady-state surface composition was reached. In both cases, the formation of a considerable amount of Mo4++Mon+ (n〈4) and Mo0 species (i.e. reduction of Mo6+ initially present in the sample) was detected. These results suggest that the high concentration of Mo4++Mon+ found upon bombardment of Mo0 with O2+ is rather produced by ballistic effects, which cause the reduction of the initially formed Mo6+. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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