Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
71 (1997), S. 1604-1606
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A scanning thermal microscope was used to measure the temperature distribution inside a vertical-cavity surface-emitting laser. The peak temperature occurred at the intersection of the optical axis and the active quantum wells, and increased with input power at a rate of 0.74 °C/mW. Comparison with model predictions showed that the n mirrors and the substrate produce higher heat generation rates, possibly due to Joule heating and/or the absorption of spontaneous emissions that are often neglected in models. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.119991
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