Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 3917-3920
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A method based on standard four-point probe geometry is described for measuring the resistivity and temperature coefficient of resistivity of conducting samples under UHV conditions. The device has been designed to be combined with in situ sample preparation and synchrotron induced photoemission, and as such it is fully compatible with a wide range of surface science experiments. The equipment has been used to measure the electrical properties of the reactive alloys CaAl and CaMg over a temperature range of −70 °C to room temperature and has been tested over a range of −100–600 °C. The results have shown that it can be used to provide immediate characterization of the amorphicity of samples for photoemission studies. The observed resistivity ranges of 14–400 μΩ cm for CaAl and 9–30 μΩ cm for CaMg are entirely comparable with previous measurements. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145394
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