Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
72 (1998), S. 1-3
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We show that UV Raman spectroscopy is eminently well suited for the in situ investigation of samples at high temperatures. Using sapphire as a test material, we have recorded Raman spectra from ambient temperature to 1700 K using different excitation wavelengths, both in the visible and near UV region of the spectrum. These spectra show that, because of the very rapid decrease of blackbody radiation in the short wavelength region, Raman spectra recorded in the near UV region of the spectrum are free from the blackbody radiation background, which typically hampers experiments in the visible. With 266 nm exciting radiation, we observe no thermal background even at 1700 K. We foresee that the method will become a powerful tool for in situ investigations of high-temperature materials. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.121437
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