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  • 1990-1994  (2)
  • 1985-1989  (1)
  • 72.80.Ey  (1)
  • 78.65-s  (1)
  • 81.60  (1)
Datenquelle
Materialart
Erscheinungszeitraum
  • 1990-1994  (2)
  • 1985-1989  (1)
Jahr
Schlagwörter
  • 1
    Digitale Medien
    Digitale Medien
    Surface chemistry of Zn3P3 single crystals studied by XPS (1987)
    Springer
    Applied physics 43 (1987), S. 197-201 
    Details
    ISSN: 1432-0649
    Schlagwort(e): 81.60 ; 82.65
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Abstract X-ray photoemission spectroscopy (XPS) has been used to study the surface reaction of Zn3P2 single crystals. The spectra of crystals exposed to H2, O2, CO2, O2+H2O or CO2+H2O during a four week period were compared to the spectra of as-grown or in UHV scraped samples. For samples contaminated with the wet gases O2+H2O and CO2+H2O additional phosphorus core levels together with a shift of the zinc core levels were observed. For crystals exposed to atmosphere during several months no phosphorus could be detected on the gasgrown surface, whereas the stochiometry of Zn3P2 was maintained within the bulk. Crystals with scraped surfaces showed no moisture sensitivity. No surface contamination was also detected for Zn3P2 crystals deposited with up to 1000 L H2O or exposed to atmosphere during 30 min.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00695623
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples (1994)
    Springer
    Applied physics 59 (1994), S. 103-108 
    Details
    ISSN: 1432-0630
    Schlagwort(e): 07.60.Pb ; 07.65.Eh ; 78.65-s
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00332201
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    Influence of growth conditions on the structural, optical, and electrical properties of ZnSe films (1992)
    Springer
    Applied physics 54 (1992), S. 455-459 
    Details
    ISSN: 1432-0630
    Schlagwort(e): 61.10.-i ; 78.55.-m ; 72.80.Ey
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract ZnSe films were grown by chemical vapour deposition on GaAs substrates. The influence of the source temperature (between 820 and 900° C) and the substrate temperature (between 620 and 790° C) on the film properties were investigated by Hall measurements, X-ray diffraction, and photoluminescence. With respect to blue luminescent devices the ratio of excitonic to deep level transitions was found to be optimum at low growth rates when the source temperatures were kept below 840° C. P-type conduction up to a net carrier concentration of 8×1018 cm−3 could be obtained by substrate temperatures above 700° C. Lattice contraction versus substrate temperature pointed to a reduced incorporation of donors at higher growth temperatures.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00324171
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