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  • 1
    Electronic Resource
    Electronic Resource
    Cross-sectional transmission electron microscopic study of Au/GaP and Au/InP contacts (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 332-336 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Au(80 nm)/GaP(111) samples were heat treated in forming gas in the temperature range of 450–550 °C. Very thin elongated α-Au(Ga) grains were grown into the GaP at 475 °C as a result of the interface reaction between Au and GaP. A surface (interface) energy driven grain growth in Au-Ga solid solution was observed after annealing at 500 °C. At 525 °C long, flat grains were formed from the thin elongated ones of α-Au(Ga). At 550 °C the metallization melted due to its high Ga content. During the solidification the shape of drops was preserved, and the metallization consisted of Au2Ga and Au7Ga2 grains. Au(100 nm)/InP(111) samples were annealed at 375 and 400 °C in forming gas for 10 min. Elongated crystals grown into the InP substrate due to the interaction between gold and InP were observed. Au9In4 grains are situated in these pits in the matrix of the Au2P3 monoclinic phase.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350277
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  • 2
    Electronic Resource
    Electronic Resource
    The direct observation and investigation of the oxidation of aluminum in the transmission electron microscope (1979)
    Springer
    Oxidation of metals 13 (1979), S. 245-254 
    Details
    ISSN: 1573-4889
    Keywords: high-purity aluminum thin films ; in situ electron microscopy ; in situ evaporation ; in situ oxidation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The authors studied the oxidation of thin aluminum films free of oxide layers in situ prepared by evaporation directly in the electron microscope under ultra-high-vacuum conditions. The oxidation was realized at various temperatures (350–500°C) and at various oxygen pressures (1–10−3 Pa). The formation and growth of the amorphous and crystalline products have been studied.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00603669
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Convergence of stress maxima in finite element computations (1994)
    Chichester : Wiley-Blackwell
    Communications in Numerical Methods in Engineering 10 (1994), S. 683-697 
    Details
    ISSN: 1069-8299
    Keywords: Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: The convergence of stress maxima, computed directly from finite element solutions, is investigated with respect to a family of exact solutions characterized by varying degrees of smoothness. The performances of h- and p-extensions and the product and trunk spaces are evaluated and documented with respect to a family of benchmark problems. In uniform p-extensions a characteristic pattern in the convergence of stress maxima was observed. There does not appear to be a clear-cut advantage of the product space over the trunk space in this respect. The much faster convergence of stress maxima in the case of p-extensions, as compared with h-extensions, is evident from the results.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/cnm.1640100903
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  • 4
    Electronic Resource
    Electronic Resource
    Hierarchic models for laminated composites (1992)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal for Numerical Methods in Engineering 33 (1992), S. 503-535 
    Details
    ISSN: 0029-5981
    Keywords: Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: The principles governing the formulation of hierarchic models for laminated composites are discussed. The essential features of the hierarchic models described herein are: (a) the exact solutions corresponding to the hierarchic sequence of models converge to the exact solution of the corresponding problem of elasticity for a fixed laminate thickness, and (b) the exact solution of each model converges to the same limit as the exact solution of the corresponding problem of elasticity with respect to the laminate thickness approaching zero. Hierarchic models make the computation of any engineering data possible to an arbitrary level of precision within the framework of the theory of elasticity. Examples are presented.
    Additional Material: 29 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/nme.1620330304
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  • 5
    Electronic Resource
    Electronic Resource
    Linear equality constraints in finite element approximationThis paper was presented at the Seventh U.S. National Congress of Applied Mechanics, University of Colorado, 3-7 June, 1974. (1975)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal for Numerical Methods in Engineering 9 (1975), S. 563-580 
    Details
    ISSN: 0029-5981
    Keywords: Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: The typical numerical problem associated with finite element approximations is a quadratic programming problem with linear equality constraints. When nodal variables are employed, the coefficient matrix of the constraint equations, [A], acquires a block-diagonal structure. The transformation from polynomial coefficients to nodal variables involves finding a basis for [A] and computing its inverse.Simultaneous satisfaction of completeness and C1 (or higher) continuity requirements establishes linear relationships among the nodal variables and precludes inversion of the basis by exclusively element-level operations.Linear dependencies among the constraint equations and among the nodal variables can be evaluated by the simplex method. The computational procedure is outlined.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/nme.1620090306
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  • 6
    Electronic Resource
    Electronic Resource
    Mathematical three-dimensional solid modeling of biventricular geometry (1993)
    Springer
    Annals of biomedical engineering 21 (1993), S. 199-219 
    Details
    ISSN: 1573-9686
    Keywords: Cardiac representation ; Ventricular geometry ; Finite element analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine , Technology
    Notes: Abstract The characterization of regional myocardial stress distribution has been limited by the use of idealized mathematical representations of biventricular geometry. State-of-the-art computer-aided design and engineering (CAD/CAE) techniques can be used to create complete, unambiguous mathematical representations (solid models) of complex object geometry that are suitable for a variety of applications, including stress-strain analyses. We have used advanced CAD/CAE software to create a 3-D solid model of the biventricular unit using planar geometric data extracted from anex vivo canine heart. Volumetric analysis revealed global volume errors of 4.7%, −1.3%, −1.6%, and −1.1% for the left ventricular cavity, right ventricular cavity, myocardial wall, and total enclosed volumes, respectively. Model errors for 34 in-plane area and circumference determinations (mean ±SD) were 5.3±6.7% and 3.8±2.7%. Error analysis suggested that model volume errors may be due to operator variability. These results demonstrate that solid modeling of theex vivo biventricular unit yields an accurate mathematical representation of myocardial geometry which is suitable for meshing and subsequent finite element analysis. The use of CAD/CAE solid modeling in the representation of biventricular geometry may thereby facilitate the characterization of regional myocardial stress distribution.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02368177
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  • 7
    Electronic Resource
    Electronic Resource
    Improved depth resolution of AES in-depth profiling (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 77-79 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In the case of conventional Auger in-depth profiling, the depth resolution increases with the thickness of the removed layer. It was demonstrated that by rotating the specimen, the depth resolution improves drastically in certain cases. Independently from this, A. Barna developed a phenomenological model to describe the change of surface topography developing due to ion sputtering. Based on his results, an Auger in-depth profiling device has been built. The capability of the device was checked by measuring in-depth profiles of Ni—Cr multilayer structure. The depth resolution determined from the measured profile is roughly constant along the depth.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190117
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  • 8
    Electronic Resource
    Electronic Resource
    Lowering the limits of detection of X-ray fluorescence analysis in the electron microscopeThe use of product or trade names of equipment, instruments or materials does not imply recommendation or constitute endorsement by the National Institute of Standards and Technology, nor does it imply that the equipment or material is necessarily the best for the purpose. (1994)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 23 (1994), S. 32-35 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A transmission-type attachment for energy-dispersive x-ray fluorescence analysis was developed. The attachment was designed for analysis to be carried out in a CAMEBAX microanalyzer, where the energy-dispersive spectrometer detector views the specimen through a hole in the objective lens and the space between the specimen and the pole piece of the objective lens is fairly small. Nevertheless, this type of attachment can be applied in other microanalyzers or scanning electron microscopes. Detection limits between 0.5 and 5 ppm on SRM 612 glass (NIST) and the applicability to the analysis of small particles (SRM 470 glass sphere 90 μm in diameter) are demonstrated.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300230107
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