Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1990-1994  (2)
  • 1950-1954
  • HREM  (1)
  • Surface structural features  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Catalysis letters 5 (1990), S. 1-11 
    ISSN: 1572-879X
    Keywords: HREM ; small Pt clusters ; zeolites
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract High resolution electron microscopy (HREM) has been used to study dispersed Pt clusters in NaY- and USY-zeolites. All the samples contained 0.8% Pt and were reduced at temperatures of 300 ° C, 500 ° C and 650 ° C. The size of the Pt clusters ranged from a few å up to ∼ 30 å. When the incident electron beam was sufficiently strong, it caused some of the extremely small metal clusters to sinter. This was usually accompanied by zeolite damage. This in-situ sintering must be taken into consideration when interpreting the particle size distribution results obtained solely by TEM, especially for particles that are smaller than 10 å. The minimum phase contrast imaging condition is demonstrated to be more appropriate than optimum defocus for detecting the extremely small Pt clusters inside the zeolite structures.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 21 (1992), S. 10-22 
    ISSN: 1059-910X
    Keywords: Relationships ; TEM and REM images ; Surface structural features ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Oxygen-annealed surfaces of sapphire with low Miller indices ((0001), {1010}, {1120}, {1011}) have been studied in both transmission electron microscopy (TEM) and reflection electron microscopy (REM) configurations. The significance of REM diffraction conditions for the determination of the nature of the step heights is discussed. The relationship between the TEM and REM images is explained. The structural features are those that might be expected from considerations of the atom arrangement in the low Miller index planes. The structural features on the surfaces varied with respect to annealing temperature and surface condition. Thermally stable structures that might appear from consideration of the equilibrium-annealing temperature are proposed.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...