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Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples (1994)

Bielefeldt, H. ; Hörsch, I. ; Krausch, G. ; [et al.]

Springer

Applied physics 59 (1994), S. 103-108

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ISSN: 1432-0630

Keywords: 07.60.Pb ; 07.65.Eh ; 78.65-s

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00332201

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Phenol/cresol-formaldehyde resin characterization and contribution to product hardness (1990)

Brauman, S. K. ; Myers-Acosta, B. L. ; Lokensgard, P. C. ; [et al.]

Stamford, Conn. [u.a.] : Wiley-Blackwell

Polymer Engineering and Science 30 (1990), S. 257-262

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ISSN: 0032-3888

Keywords: Chemistry ; Chemical Engineering

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Lot-to-lot variations in a phenol/cresol-formaldehyde resin were fully characterized. Resin property-product hardness relationships were examined to elucidate the cause of variable hardness in product insulators and to establish acceptance criteria for the resin. A high methylol content (φCH2OH), determined by quantitative carbon-13 nuclear magnetic resonance (13C-NMR), and a narrow molecular weight distribution (MWD), determined by size exclusion chromatography, were found necessary for resin to produce insulator meeting the minimum Shore D durometer specification of 40.

Additional Material: 6 Ill.