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  • 1990-1994  (4)
  • 07.65.Eh  (1)
  • 68.65  (1)
  • 72.80.Ey  (1)
  • Chemistry  (1)
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Material
Years
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Photo-induced tunneling spectroscopy of ReS2: Dramatic increase of the quantum efficiency by chemical treatment (1993)
    Springer
    Applied physics 57 (1993), S. 221-223 
    Details
    ISSN: 1432-0630
    Keywords: 68.65 ; 79.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract In this work we present a systematic study of the local photovoltaic properties of ReS2, using a scanning tunneling microscope (STM). The tunneling junction of the STM was optically illuminated during the tunneling process. The phase sensitive detected photo-induced tunneling current (PITC) was studied as a function of wavelength and surface topography. In order to improve the performance of ReS2 solar cells, the samples were treated with NaI/I2 and EDTA solutions. Relative to the untreated sample, the EDTA-treated samples show an increase in the photo-induced tunneling current by a factor of 8–10 in the whole spectral range, the NaI/I-treated samples by 2–3. Two dimensional mapping of the PITC was performed on an atomic scale and compared to the surface topography.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00332592
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples (1994)
    Springer
    Applied physics 59 (1994), S. 103-108 
    Details
    ISSN: 1432-0630
    Keywords: 07.60.Pb ; 07.65.Eh ; 78.65-s
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00332201
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Influence of growth conditions on the structural, optical, and electrical properties of ZnSe films (1992)
    Springer
    Applied physics 54 (1992), S. 455-459 
    Details
    ISSN: 1432-0630
    Keywords: 61.10.-i ; 78.55.-m ; 72.80.Ey
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract ZnSe films were grown by chemical vapour deposition on GaAs substrates. The influence of the source temperature (between 820 and 900° C) and the substrate temperature (between 620 and 790° C) on the film properties were investigated by Hall measurements, X-ray diffraction, and photoluminescence. With respect to blue luminescent devices the ratio of excitonic to deep level transitions was found to be optimum at low growth rates when the source temperatures were kept below 840° C. P-type conduction up to a net carrier concentration of 8×1018 cm−3 could be obtained by substrate temperatures above 700° C. Lattice contraction versus substrate temperature pointed to a reduced incorporation of donors at higher growth temperatures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00324171
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Phenol/cresol-formaldehyde resin characterization and contribution to product hardness (1990)
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 30 (1990), S. 257-262 
    Details
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Lot-to-lot variations in a phenol/cresol-formaldehyde resin were fully characterized. Resin property-product hardness relationships were examined to elucidate the cause of variable hardness in product insulators and to establish acceptance criteria for the resin. A high methylol content (φCH2OH), determined by quantitative carbon-13 nuclear magnetic resonance (13C-NMR), and a narrow molecular weight distribution (MWD), determined by size exclusion chromatography, were found necessary for resin to produce insulator meeting the minimum Shore D durometer specification of 40.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/pen.760300502
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    Paper (German National Licenses)
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