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  • 1990-1994  (3)
  • Polymer and Materials Science  (2)
  • 65N99  (1)
  • 31.20.T
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Computing 51 (1993), S. 237-269 
    ISSN: 1436-5057
    Keywords: 65J05 ; 65J15 ; 65N10 ; 65N99 ; Higher singular points ; numerical Liapunov-Schmidt method ; bifurcating manifolds ; nonlinear elliptic problems
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Description / Table of Contents: Zusammenfassung Für einen höheren singulären Punktx 0 einer OperatorgleichungG(x 0)=0 und die Nullräume der jeweiligen AbleitungenG′(x 0) undG′(x 0)*, siehe [1], seien Approximatioinen bekannt. Dann definieren wir ein numerisches Verfahren zur Berechnung der inx 0 abzweigenden Lösungsmannigfaltigkeiten. Die Frage der Konvergenz der numerischen gegen die exakte Lösung wird studiert durch Nachweis der entsprechenden Stabilitäts- und Konvergenzeigenschaften von Lösungsanteilen verschiedener Größenordnungen. Das Verfahren wird angewandt auf ein elliptisches Problem.
    Notes: Abstract Let, for a higher singular pointx 0 of an operator equationG(x 0)=0 and the kernels of the respective derivativesG′(x 0) andG′(x 0)*, see [1], approximations be available. We present a method to numerically compute the manifolds bifurcating atx 0. In particular, the question of convergence of the numerical to the exact solution is studied by proving stability and convergence for solution parts of different order of magnitude. Different approaches are presented and applied to elliptic problems.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 598-602 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Grimm glow discharge spectrometry was used to analyse electroless nickel coatings on a steel substrate. Because of poor depth resolution at the coating/metal interface, it was necessary to determine the sputtering rate of the layer itself at different power settings and to calculate the sputtering rate per power unit. The penetration time for layers with different thicknesses was also determined for different power settings. By comparing sputtering rates per power unit, it was found that the best results were obtained if the penetration time was equated to the time needed for the nickel signal to reduce to half its original value.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 219-220 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Surface analysis with a Grimm-type glow discharge lamp was used to analyse uranyl fluoride layers that had formed on a nickel sufbstrate after exposure to UF6. Narrow-band optical filters were used to isolate the intensities of three fluorine emission lines. An in-depth profile of layer composition was obtained.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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