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  • 1990-1994  (2)
  • 72.80.Ey  (1)
  • 78.65-s  (1)
Datenquelle
Materialart
Erscheinungszeitraum
  • 1990-1994  (2)
Jahr
Schlagwörter
  • 1
    Digitale Medien
    Digitale Medien
    Influence of growth conditions on the structural, optical, and electrical properties of ZnSe films (1992)
    Springer
    Applied physics 54 (1992), S. 455-459 
    Details
    ISSN: 1432-0630
    Schlagwort(e): 61.10.-i ; 78.55.-m ; 72.80.Ey
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract ZnSe films were grown by chemical vapour deposition on GaAs substrates. The influence of the source temperature (between 820 and 900° C) and the substrate temperature (between 620 and 790° C) on the film properties were investigated by Hall measurements, X-ray diffraction, and photoluminescence. With respect to blue luminescent devices the ratio of excitonic to deep level transitions was found to be optimum at low growth rates when the source temperatures were kept below 840° C. P-type conduction up to a net carrier concentration of 8×1018 cm−3 could be obtained by substrate temperatures above 700° C. Lattice contraction versus substrate temperature pointed to a reduced incorporation of donors at higher growth temperatures.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00324171
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 2
    Digitale Medien
    Digitale Medien
    Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples (1994)
    Springer
    Applied physics 59 (1994), S. 103-108 
    Details
    ISSN: 1432-0630
    Schlagwort(e): 07.60.Pb ; 07.65.Eh ; 78.65-s
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Maschinenbau , Physik
    Notizen: Abstract Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF00332201
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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    Artikel (Nationallizenzen)
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