Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1990-1994  (4)
  • Chemistry  (4)
  • ISO/TC 201 on Surface Chemical Analysis
Source
Material
Years
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    The reliability of quantitative analysis with AES (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 140-143 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Japanese VAMAS-SCA working group is composed of 19 institutes. Three kind of Au—Cu alloys (Au 75 at.-%-Cu 25 at.-%, Au 50 at.-%-Cu 50 at.-%, Au 25 at.-%-Cu 75 at.-%) were prepared, and these specimens, pure Au and pure Cu were distributed to the members of the VAMAS-SCA working group. The surface concentrations of these alloys were calculated from the Auger peak amplitudes in two ways. One method used the published relative sensitivity factors, and the other used pure Au and Pure Cu as the standard materials. The mean values of the surface concentrations calculated with the published relative sensitivity factors were almost the same as those calculated with the standard materials. This means that the published relative sensitivity factors are reliable to some extent. The error of the surface concentration calculated with pure Au and pure Cu as the standard materials lay between about 3% and 10%, and that with the relative sensitivity factors lay between about 7% and 20%. The calculated surface concentrations of Au were larger than the bulk concentrations of Au when the matrix effect was neglected.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160127
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Activities of ISO technical committee 201 on surface chemical analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 615-620 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A status report is given on activities of ISO Technical Committee 201 (ISO/TC 201) on Surface Chemical Analysis. The committee has seven subcommittees which met for the first time in 1993. Information is given on the working groups that have been established for specific purposes. We show national participation in ISO/TC 201 and its subcommittees, and we identify the chairmen and secretariats of the subcommittees and the conveners of the working groups.
    Additional Material: 10 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210904
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Formation of Technical Committee 201 on Surface Chemical Analysis by the International Organization for Standardization (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 322-325 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The International Organization of Standardization (ISO) recently created a new Technical Comittee (ISO/TC 201) on Surface Chemical Analysis in response to a proposal from Japan. As of February 1993, ten national standards bodies had indicated willingness to become participating members of ISO/TC 201 (Austria, China, Germany, Italy, Japan, Russia, Sweden, Turkey, the United Kingdom and the United States of America) and fifteen national standards bodies had indicated willingness to become observer members (Australia, Belgium, Egypt, Finland, France, India, Ireland, Korea, Norway, Philippines, Poland, Romania, Singapore, South Africa and Switzerland). The following subcommittees are planned: Terminology; General Procedures; Data Management and Treatment; Depth Profiling; Auger Electron Spectroscopy; Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy. It is expected that working groups will be established for Glow Discharge Optical Spectroscopy and Total Reflection X-ray Fluorescence Spectroscopy. ISO/TC 201 will develop international standards and will consider standards and documents prepared by other groups as potential international standards. Information is given in this article on the purpose, structure and planned work of ISO/TC 201.
    Additional Material: 3 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200410
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Evaluation of correction accuracy of several schemes for AES matrix effect correctionsPaper presented at ECASIA 89, Antibes, France, 23-27 October 1989. (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 466-472 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A matrix effect correction is required to improve the accuracy of quantitative AES analysis. The correction includes terms involving the atomic density (n), electron back-scattering factor (R) and electron escape depth (L). Many schemes have been proposed by various people for corrections of the R and L terms. However, up to now, there have been no systematic investigations of the correction accuracy of the proposed schemes. We have evaluated the correction accuracy, based on measured intensity data for Au—Cu alloys of different compositions. Comparison was made between the observed intensity ratio K (=Iunk/Istd) and the calculated intensity, ratio K′ (= C(nunk/nstd)(Runk/Rstd)(Lunk/Lstd)), where C and I represent the concentration and intensity, respectively. The superscripts ‘unk’ and ‘std’ denote that the parameters are for unknown and standard specimens, here the pure elements. If the correction works well, the error Er (= K′ — K)/(K) will become smaller. Evaluations were carried out on three schemes for the R correction and on seven schemes for the L correction using the Au 239 eV, Au 2024 eV and Cu 920 eV transitions. The root mean square (RMS) of the calculated errors showed several per cent for the best case and 20-30% for the worst case. The RMS error varied a few per cent between schemes for the R correction but it varied ∼30% for the L correction.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740150805
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...