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  • 1990-1994  (1)
  • Scanning tunnelling microscope (STM)  (1)
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  • 1990-1994  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 2 (1993), S. 71-77 
    ISSN: 1057-9257
    Keywords: Scanning tunnelling microscope (STM) ; Tip ; HOPG ; Nanofabrication ; In situ processing ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: The STM tip shape was found to change when nanofabrication using a scanning tunnelling microscope (STM) was attempted by applying voltage pulses between the tip and the sample. This change, which is considered to be caused by the voltage pulses, was studied systematically to investigate the thermal contribution to nanofabrication using STM tips. The tips become easily damaged as the pulse amplitude and pulse width increase or the tunnelling gap decreases. Thermal reaction, including thermochemical reaction, is considered to play an important role in such nanofabrication.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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