Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
63 (1993), S. 1906-1908
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240–1500 °C, is about five times greater for vitreous silica than for β-cristobalite.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.110644
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