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  • 1990-1994  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Probe calibration in magnetic force microscopy (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2612-2614 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103827
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of domain wall stray fields on single-crystal iron whiskers (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 2578-2580 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a capacitively controlled force microscope we have imaged typical domain wall configurations like 90° closure structures and subdivided 180° wall segments in single-crystal iron whiskers. Differences in wall contrast between 90° and 180° domain walls are clearly observed. The effect of tip-to-sample distance on lateral resolution and wall contrast in magnetic force microscopy is shown.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102847
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Improved microtips for scanning probe microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2538-2541 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Improved electrochemical techniques for the reproducible fabrication of sharp metallic tips are presented. Radii of curvature down to 10 nm make the tips particularly suitable for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Additionally, simple methods are developed for preparing AFM cantilevers. A new type of spherical probe suitable for long-range scanning force microscopy has been fabricated. The probes consist of nearly perfect spheres with adjustable radii between about 50 and several 100 nm deposited at the very tip of tiny probe holders. Both probe and probe holder may consist of any metal. First experimental investigations confirm that the spherical probes are particularly suitable for van der Waals and magnetic force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141911
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    Paper (German National Licenses)
    Fulltext
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