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  • 1990-1994  (3)
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Material
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Deep donor levels in Sn-doped AlxGa1−xAs (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 5952-5956 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The properties of the Sn-doped AlxGa1−xAs alloys with various compositions have been studied by deep level transient spectroscopy and photocapacitance methods. Two deep donor levels with the thermal activation energies of 0.19 and 0.32 eV are found in all of the samples. Detailed data for the thermal emission and capture activation energies, optical ionization energies, and their composition dependence are given for the first time. Because their electronic properties are similar to that of the typical Si DX level in AlxGa1−xAs, it is concluded that both Sn-related levels are the DX-like levels.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350445
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A PC-based instrument of a modified differential normal pulse voltammetry with background current correction technique (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1679-1685 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Instead of the fixed pulse durations in conventional differential normal pulse voltammetry, a PC-based instrument using adaptable pulse duration vectors for background current correction has been proposed and implemented. With this PC-based instrument, a sequence of pulse duration vectors is determined in an initial blank solution voltammetry by assigning a decay percentage constant to the charging current. These vectors are then used in the subsequent test solution in order to obtain a pure oxidation current response in a resulting voltammogram with its corresponding features. Experimental results are presented to show the effectiveness and advantages of the PC-based instrument for the measurements of dopamine in a phosphate buffered solution.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144859
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    The application of cluster analysis in X-ray diffraction phase analysis (1992)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 25 (1992), S. 336-339 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: This paper proposes a method using cluster analysis to classify X-ray diffraction lines of a multiphase mixture into different phases. This classification of lines is useful in both qualitative and quantitative phase analysis. An example of a three-phase mixture is given to illustrate this method.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889891012372
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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