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  • 1990-1994  (5)
Material
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 845-849 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A laboratory spectrometer designed for routine extended x-ray absorption fine structure (EXAFS) measurements in dispersive mode is described. Factors determining energy range and resolution are detailed. An empirical energy calibration procedure is proposed. EXAFS spectra obtained for copper and zirconium metal foil and molecular complex ZrOCl2 compare favorably with data obtained using a conventional synchrotron facility.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Oxford [u.a.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 750-752 
    ISSN: 1600-5759
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Oxford [u.a.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 1057-1059 
    ISSN: 1600-5759
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 27 (1992), S. 3286-3292 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Large angle X-ray diffraction studies were performed on vapour deposited Zn-P amorphous films with phosphorus contents of 43, 50 and 68 at %. Using MoKα radiation, measurements have been made for 4πsinθ/λ between 0.06 and 1.6 nm−1. The experimental method and data reduction procedure are described. The structure of the amorphous Zn-P films is analysed using both intensity and radial distribution functions. The experimental results are compared with a number of paracrystalline models based on various crystalline polymorphs of the II-V system. Comparison shows that reasonable agreement is achieved for distorted tetrahedral structures: the intermediate between CdAs and Si type III for Zn57P43 and Zn50P50 and the distorted CdAs2 for Zn32P68. The sizes of the microparacrystals are evaluated from the integral widths of the first diffraction peaks and the lattice distortions by applying paracrystalline theory. It is shown that the size of the microparacrystal and the degree of the lattice distortion are correlated by the α* relation for the investigated Zn-P amorphous films.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 25 (1990), S. 3739-3745 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Monolithic crack-free condensates have been synthesized by hydrolysis and polycondensation of tetraethoxytitanium(IV) and γ-glycidoxypropyltrimethoxysilane. The local order in these materials has been studied by large angle X-ray scattering (LAXS) as well as the influence of Ti4+-Ti3+ transition induced by UV irradiation. The polysiloxane is characterized by a quasiregular arrangement of the side-chains similar to the proposed models for liquid-crystalline polysiloxane. Titanium atoms, in an octahedral environment, are coordinated to the diol functions. If the metal percentage is higher than 20%, the titanium atoms are distributed on several sites.
    Type of Medium: Electronic Resource
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