Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
61 (1992), S. 2987-2989
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Steady-state electromigration along grain boundaries in a monatomic polycrystalline thin film has been analyzed in a two-dimensional model by balancing the (applied) electric and (induced) stress driving forces to achieve a zero flux divergence. The continuity of chemical potential requires a unique stress normal to each of the three boundaries terminating at a given triple point. These stresses and the steady-state fluxes are determined by a set of linear equations subject to boundary conditions at the intersection of grain boundaries with the film edge (edge points). When the normal stress is assumed zero at all edge points, the stress typically attains maxima and minima at triple points, whereas, when the flux is assumed zero at all edge points, the stress typically builds up monotonically in the field direction.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.108011
Permalink
| Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |
