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  • 1990-1994  (5)
  • 1
    Electronic Resource
    Electronic Resource
    A dual-scan piezo element for scanning probe microscopes (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2416-2416 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple method of achieving dual scan ranges with a single piezo element in scanning probe microscope instruments is described. Both high-resolution small-scan ranges and low-resolution large-scan areas are obtainable.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144700
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscope data acquisition and control in visual basic (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 3530-3533 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A general purpose data acquisition and control system for scanning tunneling microscopy (STM) using Visual Basic is presented. This Windows hosted Visual Basic environment is highly desirable for use in STM image manipulation, storage, and printing, but in its standard form is not suitable for most data acquisition and display applications. Many of the inherent limitations in the Visual Basic language have been overcome by the use of direct calls to the Windows Application Program Interface. In this paper, we describe a general Visual Basic STM user interface and control system, and the extensions to the language using the Windows API needed to implement this system.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144278
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy of polythiophene, poly(3-methylthiophene), and poly(3-bromothiophene) (1990)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 94 (1990), S. 5639-5641 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100378a002
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    On a bottleneck bipartition conjecture of Erdős (1992)
    Springer
    Combinatorica 12 (1992), S. 317-321 
    Details
    ISSN: 1439-6912
    Keywords: 05 C 35
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract For a graphG, let γ(U,V)=max{e(U), e(V)} for a bipartition (U, V) ofV(G) withUυV=V(G),UφV=Ø. Define γ(G)=min(U,V ){γ(U,V)}. Paul Erdős conjectures $$\gamma (G)/e(G) \leqslant {1 \mathord{\left/ {\vphantom {1 4}} \right. \kern-\nulldelimiterspace} 4} + O\left( {1/\sqrt {e(G)} } \right)$$ . This paper verifies the conjecture and shows $$\gamma (G)/e(G) \leqslant {1 \mathord{\left/ {\vphantom {1 4}} \right. \kern-\nulldelimiterspace} 4}\left( {1 + \sqrt {2/e(G)} } \right)$$ .
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01285820
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Scanning probe microscope imaging of polyaniline thin films in non-contact mode (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 814-817 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The structure of electropolymerized thin films of polyaniline has been studied using the techniques of contact and non-contact scanning probe microscopy (SPM). Films exposed to Ir+ cations in solution, as well as unexposed films, were examined. Contact-mode SPM images of these films reveal only a diffuse, amorphous surface structure in both types of film, while non-contact SPM images indicate an intricate, nanometer-scale domain structure. Film growth is in a layer-by-layer mode, with each layer consisting of small polymer bundles of average dimension 1000 ± 75 Å. The Ir+ incorporation in these films does not involve a restructuring of the film morphology. The relevance of the microscopic domain structure to models describing conduction mechanisms in these films is also discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740211113
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    Paper (German National Licenses)
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