ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The validities of the Warren–Averbach analysis and of an alternative analysis for separation of size and strain contributions to diffraction line broadening are investigated. The analyses are applied to simulated and experimental line profiles. The Fourier coefficients of the simulated line profiles are derived from expressions for the distortion field around specific lattice defects: misfitting inclusions and small-angle grain boundaries. Applicability tests are also performed on experimental powder diffraction line profiles taken from plastically deformed specimens: thin aluminium layers and ball-milled molybdenum powders. It is concluded that for both methods finite but different classes of specimen exist for which they give meaningful results. In practice, each time an analysis is performed the results must be tested against common (physical) sense and all information available on the specimens.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889893010568
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