Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
15 (1986), S. 241-243
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A simple model of the x-ray Kα emission spectrum of copper metal has been proved to fit the experimental distribution curve of diffracted intensity fairly well, after correcting for profile distortion due to the spectrometer geometry and the diffraction process. Each Kα line can be described by a doublet of overlapping dispersion curves of different height and width. Although the physical relevance of the model is not clear at present, the simple analytical expression of the spectrum may be useful for some problems in x-ray diffractometry.
Additional Material:
2 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300150405
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