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  • 1985-1989  (5)
  • Polymer and Materials Science  (5)
  • Cardiac muscle
  • Physics
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 30 (1985), S. 4099-4111 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: A polyamide-epichlorohydrin resin used to shrink-resist wool [Hercosett 125 (Hercules Inc.)] was separated by ultrafiltration into fractions A, B, and C (in the approximate proportions 60, 40, and 2 by weight), which correspond to the three peaks in size exclusion chromatograms (SEC). Viscosity, spectra, and SEC results as well as results of experiments on the reaction of the parent polyamino-polyamide (PAA) with epichlorohydrin indicated that fraction A was high-molecular-weight crosslinked material whereas fraction B was essentially uncrosslinked. Fraction C was minor impurity, possibly a mixture containing a triazine, and it was also found in the PAA from which the original resin was prepared. High-resolution proton NMR spectra of the Hercosett 125 indicated that chlorohydrin or epoxy groups were absent, and thus confirmed an earlier 13C-NMR study that only azetidinium reactive groups were present. Two reactions are believed to occur in Hercosett 125 on storage: hydrolysis of azetidinium to dihydroxypropyl groups and hydrolysis of backbone amides. The small differences in the properties of wool treated with either A or B fractions, and those of wool treated with unfractionated Hercosett 125, were related to the extent of crosslinking before and after curing. As the extent of crosslinking increased, the amount of staining by an anionic dye decreased, and the shrink resistance improved slightly.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The concept of an imaging XPS system is analysed and the various approaches discussed. For instrument and design flexibility it is shown that a standard XPS system with an efficient input lens can be used to form a virtual image of the spectrometer input aperture on the sample surface. This defined area of analysis may be rastered across the sample surface using a pre-lens scanning deflector system. In this way good XPS images of 256 × 256 pixels and of 250 μm resolution over an area of diameter 10 mm may be formed in ten minutes. Examples are provided from components for the electronics assembly industry demonstrating that insulators cause no problems. Design considerations are then detailed for optimizing imaging XPS systems at 25 μm and 10 μm spatial resolution involving pre-lens scanning systems and position-sensitive detectors.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 105-109 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The precise shape of the whole electron spectrum in AES is defined by (i) the physics of the process, and (ii) the intensity/energy transmission function of the measurement system. In many systems item (ii) is uncharacterized and surveys show variable effects of over an order of magnitude. This gives rise to equivalent errors in quantitative AES where published data banks are used and the spectrometers are uncalibrated.In this study we consider both the process and the measurement system, and show how the parameters of each may be measured and how each affects the final measured spectrum in the direct mode. The factors considered include the orientation of both the incident and emitted electrons, and the energy dependence of the transmissivities of the spectrometer and the detection system. Detailed measurements of high accuracy for a copper reference sample show the extent to which the reference procedures may be followed and equivalent data be recorded from different instruments.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The precise shape of the whole direct spectrum in AES depends on the processes in the sample and on the properties of the measurement system. In this paper we characterize, in detail, the intensities emitted from ion sputter-cleaned copper and silver foils in the direct spectrum in order to understand better the processes in the sample controlling those intensities. Characterizations of the dependencies of the intensities on the angle of incidence of the electron beam and on the angle of emission of the detected electrons provide rules allowing the transference of reference spectra between different instrumental cinfigurations and conditions. The precise evaluation of the rules is essential if reference data banks are to be transferred for instrument to instrument. Furthermore, by tracing the spectra back to an instrument with known properties we may establish standard reference spectra, which may then be used to calibrate, in other instruments, the combined energy dependencies of the spectrometer transmission function and detector sensitivity with accuracy. This calibration enables all instruments to be used to measure true spectra for the first time.
    Additional Material: 18 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 55-63 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A scanning acoustic microscope (SAM) operating at 750 MHz has been used to image artificially induced cracks in polycrystalline and single crystal specimens of alumina. Although the resolution of the instrument used in this work, at 1.6m̈m, was not as good as that of an optical microscope, significantly more information about the crack characteristics was revealed acoustically. Cracks of finite width act as scattering points for acoustic waves and thus sources of contrast in the SAM image, even when their width is less than the theoretical spatial resolution. In polycrystalline samples it was found that defocussing the SAM both above and below the focal plane, utilising different regions of the V(z) response, enabled contrast due to grain boundaries, cracks, and individual grains to be distinguished. It was also possible to identify different modes of cracking. For the single crystal samples, distinctive contrast was obtained from both horizontal and vertical sub-surface cracks within one Rayleigh wavelength of the surface. In most materials, features such as these are not readily detectable by other techniques.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
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