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  • 1985-1989  (4)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 989-992 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: NdFe(B) thin films are deposited onto glass substrates by means of a tungsten crucible. The as-deposited films are studied by the Lorentz microscopy method in order to observe the different magnetic domains. STEM analysis (EELS method) permits us to obtain the characteristic absorption edges of Fe and Nd (but not of boron). The crystallization behavior, inside the electron microscope, by means of the electron beam, allows us to observe the formation of the α-Fe, A-Nd2O3, and NdFeO3 phases. The different stages of appearances of these structures are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 241-243 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Grain boundary (GB) electrical activity is increased by heat treatment in silicon; the origin of the phenomenon is a subject of controversy and is often attributed to oxide precipitation. This letter presents microanalytical results (conventional and scanning transmission electron microscopy, energy dispersive x-ray spectroscopy, and electron energy loss spectroscopy), obtained on a Σ=25 bicrystal before and after annealing in sealed ampoules at 900 °C. The enhancement of the electrical activity, confirmed by electron beam induced current and deep level transient spectroscopy, is shown to appear at the boundary simultaneously with precipitates containing copper and nickel. The major role of the fast diffusing 3d metals on the GB electrical properties is demonstrated.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 12 (1989), S. 333-339 
    ISSN: 1434-6079
    Keywords: 61.16.Di ; 71.45.Gm ; 79.20.H
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The finely focused electron beam of a STEM microscope provides a very powerful probe for the investigation of the local chemical and electronic properties of small particles. After a general description of different techniques which have been developed to take benefit of the Electron Energy Loss Signal (EELS) in this configuration, we describe two experiments under progress. The first one concerns clusters of iron oxide particles in a magnetic superlattice, the second one deals with silicon spheres. These examples involve quite different excitations which are respectively more characteristic of the properties of the bulk (core loss edges) or of the surface (plasmon modes).
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 3-10 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Anaytical electron microscopy (AEM) consists of extending the information generally delivered by the electron microscope (topography, structure) with a knowledge of the chemical and electronic properties. Its major advantage is to perform higly sensitive spectroscopies, such as electron energy loss spectroscopy (EELS), on nanovolumes of materials defined and localized within their environment. It is therfore well suited to the study of complex specimens, such as catalytical products, in which there is a competion of bulk and surface properties. Metallic Co particles on supporting CeO2 layers provide an illustrative example of AEM capabilities. Atomic resolution images of surfaces and interfaces are associated with EELS spectroscopy and EELS maps to obtain a detailed view of the local arrangement of the different components, at successive steps of the chemical reaction. Nevertheless, beaminduced chemical tranformations of the system have been observed at the atomic scale. Radiation damage therefore constitutes the final limitation.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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