ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A programmable scan controller to implement a fast access readout of individual photodiodes in a self-scanned silicon photodiode array (SPDA) was assembled using transistor–transistor logic (TTL) presettable counters handled by a single-chip microcontroller. This controller makes it possible to skip groups of unwanted diodes at fast scan rate, whereas the others are read and digitized at normal scan rate. The skipping scan rate (Fs) and the reading scan rate (Fr) are switch selectable, the former in the 4 MHz–250 kHz range, the latter in the Fs/2–Fs/4095 range. Any scan pattern is software programmable. Up to 29 groups of contiguous diodes can be skipped. Integration time and number of scans are also software programmable. Programming is accomplished by the host computer issuing the scan parameters through a strobed 8-bit parallel port to the microcontroller, which provides for the controls necessary for the scan pattern generation required.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138549
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