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  • 1985-1989  (8)
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  • 1
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths for 31 materials (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 577-589 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: We present new calculations of electron inelastic mean free paths (IMFPs) for 200-2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four compounds (LiF, SiO2, ZnS and Al2O3). These calculations are based on an algorithm due to Penn which makes use of experimental optical data (to represent the dependence of the inelastic scattering probability on energy loss) and the theoretical Lindhard dielectric function (to represent the dependence of the scattering probability on momentum transfer). Our calculated IMFPs were fitted to the Bethe equation for inelastic electron scattering in matter; the two parameters in the Bethe equation were then empirically related to several material constants. The resulting general IMFP formula is believed to be useful for predicting the IMFP dependence on electron energy for a given material and the material-dependence for a given energy. The new formula also appears to be a reasonable but more approximate guide to electron attenuation lengths.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740111107
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    The status of reference data, reference materials and reference procedures in surface analysis (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 46-50 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A brief synopsis is given of recent developments and current needs for reference data, reference materials and reference procedures in surface analysis. This assessment is based largely on three presentations and related discussion at the Second Topical Conference on Quantitative Surface Analysis held at Monterey, California on 30-31 October, 1987. While a reasonable start has been made in recent years in providing needed data, materials, and procedures, many important needs remain.
    Additional Material: 1 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740130110
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Calculations of electron inelastic mean free paths from experimental optical data (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 263-274 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Calculations are reported of inelastic mean free paths (IMFPs) for 100-2000 eV electrons in C, Mg, Al, Al2O3, Cu, Ag, Au, and Bi from experimental optical data. These calculations require knowledge of the momentum-transfer dependence of the differential scattering cross section; this information was taken from Penn's calculations. The calculated IMFPs agree reasonably with direct calculations and with measured electron attenuation lengths (ALs). Since accurate measurements of ALs are difficult, it is suggested that calculations of the present type are useful if the needed optical data are available. The present approach is also useful for materials (such as the transition and noble metals) for which it is not possible to make a meaningful distinction between valence-electron and core-electron excitations as required in current IMFP calculations. The dependence of the calculated IMFPs on electron energy varied with material and was associated with different spectral distributions of the electron energy-loss function. The trend in the dependence of IMFP on energy was similar to that found in analysis of AL data.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070604
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    The energy dependence of electron attenuation lengths (1985)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 256-262 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analysis has been made of electron attenuation length data for nine materials in terms of the Bethe theory for inelastic scattering in matter. It was found that the Bethe equation adequately described the energy dependence of the data in all materials over the typical range 100-1500 eV. The Bethe equation appears to be superior to the empirical relation proposed by Wagner, Davis, and Riggs (1980).
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740070603
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Surface chemical analysis - report on the vamas project (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 79-83 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The VAMAS project on surface chemical analysis is a multi-national cooperation for the provision of standards data and materials for surface chemical analysis measurement and for the provision of the basic understanding necessary for these activities. This project is one of a rapidly growing suite of projects initiated as a result of decisions following the 1982 Versailles Summit Meeting of the Heads of State or Government of Canada, France, Germany, Italy, Japan, UK, USA and the representatives of the Commission of the European Communities. During the past year national representatives to this VAMAS project have been appointed and national committees established. This article summarizes the philosophy, scope, and organization of the project and describes specific activities that have been initiated. Information is given on how individuals, both within and outside the group of member states, may participate.
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090202
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  • 6
    Electronic Resource
    Electronic Resource
    Characterization of the imaging properties of a double-pass cylindrical-mirror analyzer (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 111-117 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The imaging properties of a double-pass cylindrical-mirror analyzer have been investigated using extensions of the technique recently described by Seah and Mathieu. Elastic-peak intensity data obtained as an electron beam was rastered across a test specimen, was recorded in digital form and later used to generate ‘three-dimensional’ images. Images have been obtained for a range of operating conditions and for displacements of the specimen from its optimum position. Measured image widths were in semi-quantitative agreement with those expected from a simple analysis although deviations attributed to instrument imperfections were found. Elastic-peak images provide a convenient and quantitative means of assessing instrument performance and defining the specimen area being analyzed for the selected conditions.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090206
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    The development of standards for surface analysisUpdated version of an invited paper presented at the Fourth International Conference on Quantitative Surface Analysis, held at the National Physical Laboratory, Teddington, UK, 18-20 November, 1986. (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 103-109 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: As the use of surface analysis increases, the need for standards (reference procedures, reference data, and reference materials) becomes more urgent. This article describes recent activities and current plans of three organizations that are active in developing standards for surface analysis: Committee E-42 on Surface Analysis of the American Society for Testing and Materials; the Surface Chemical Analysis Working Party of the Versailles Project on Advanced Materials and Standards (VAMAS); and the Working Group on Surface Analysis of the International Union of Pure and Applied Chemistry.
    Additional Material: 8 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740110113
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    Paper (German National Licenses)
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  • 8
    Electronic Resource
    Electronic Resource
    The energy dependence of electron inelastic mean free paths (1987)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 10 (1987), S. 349-354 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An analysis has been made of the dependence on electron energy of calculated inelastic mean free paths (IMFPs) for aluminum, copper, silver, and gold from four recent sources of data. The analysis was made using Fano plots which clearly show differences in energy dependences. In addition, the slopes of linear regions in the Fano plots can be compared with values calculated from experimental optical data and with values obtained from Fano plots made with experimental attenuation length (AL) data. It was found that the slopes of the Fano plots using IMFPs from calculations of Powell and Penn agreed well with the optical results; there was generally good agreement for the IMFPs of Ashley et al., but the slopes using the IMFP data of Szajman et al. exceeded the optical values by 9-40%. The slopes in the Fano plots using AL data for Al, Cu, and Au exceeded the optical values by 29-54 %; this result is similar to those found in other analyses and indicates that the electron energies for these AL measurements were not high enough to be in the asymptotic Bethe region. Analysis of the optical data also showed that a lower limit for the electron energy range over which the Fano plots could be expected to be linear (with their asymptotic slopes) was about 400 eV for Al and about 1000 eV for Cu, Ag, and Au. More extensive AL measurements over a wide electron energy range are needed to determine the shapes of the Fano plots for different types of materials.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740100707
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    Paper (German National Licenses)
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