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  • 1
    Electronic Resource
    Electronic Resource
    The calculation of background in wavelength-dispersive electron microprobe analysis (1981)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 198-202 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A procedure has been developed for the calculation of background corrections in wavelength-dispersive electron microprobe analysis which reduces data acquisition times and offers the possibility of greater accuracy and lower detection limits, especially when the number of peaks concerned is large. An empirical ‘normalized background’ in conjunction with a modified version of Kramers' law (as developed for energy-dispersive analysis) is used to calculate continuum intensity, enabling the background to be estimated for any wavelength from a single measured value. This approach is compatible with modern trends towards automation of data acquisition and processing.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300100412
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Window contamination of energy-dispersive detectors in electron microprobe analysis (1981)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 78-81 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Oil film contamination of the Be window of a Si detector has been demonstrated using archival information on X-ray intensities from calibration standards acquired over a two and a half year period. Although cleaning the window with a solvent restores sensitivity for soft radiation, recontamination can be rapid unless a small heating device is placed close to the window. A mathematical correction is suggested which avoids significant analytical errors from the effect of any contamination which may be present. It can be applied automatically by data processing software using information from the calibration standard spectrum.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300100209
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
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