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  • 1
    Electronic Resource
    Electronic Resource
    Submillimeter and millimeter optical constants of liquid nitrogen (1983)
    Springer
    International journal of infrared and millimeter waves 4 (1983), S. 145-152 
    Details
    ISSN: 1572-9559
    Keywords: liquid nitrogen ; absorption coefficient ; refractive index ; submillimeter and millimeter optical constants ; blackbody calibration
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We present power absorption coefficient measurements of liquid nitrogen in the range 4–28 cm−1 and measurements of the average value of the refractive index for the range 4–10 cm−1. The measurements were performed with a polarizing Michelson interferometer. The power absorption coefficient rises quadratically from 0.006±0.002 nepers cm−1 at 4 cm−1 to 0.381±0.009 nepers cm−1 at 28 cm−1. The average value of the refractive index is 1.20±0.03 between 4 and 10 cm−1.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01008973
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Submillimeter and millimeter reflection spectroscopy of vacuum compatible absorbing materials (1983)
    Springer
    International journal of infrared and millimeter waves 4 (1983), S. 591-597 
    Details
    ISSN: 1572-9559
    Keywords: reflection spectroscopy ; submillimeter and millimeter wave materials ; blackbody calibration ; Corning Macor ; boron carbide ; silicon carbide
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We report on Fourier transform reflection spectroscopy of materials that are candidates for use as absorbers in beam dumps and blackbody calibration sources for submillimeter and millimeter wave plasma diagnostics. The materials have been chosen for vacuum compatibility and resilience to plasma bombardment. Data are presented at 4 and 28 cm−1 on the materials: Avco hot-pressed SiC, Dielectric Communications SiC 9030, Avco hot-pressed B4C, and Corning Macor, a machinable glass ceramic.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01009397
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Density profiles in tokamaks from electron cyclotron radiation spectra (1980)
    Springer
    International journal of infrared and millimeter waves 1 (1980), S. 45-55 
    Details
    ISSN: 1572-9559
    Keywords: density profiles ; tokamak ; electron ; cyclotron ; emission
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Measurement of the line shape of optically thick and optically thin lines in the electron cyclotron radiation spectrum emitted by a tokamak plasma may yield both electron temperature and density profiles. Currently temperature profiles are routinely extracted from optically thick lines. Consequently, this paper is addressed to the density profile problem. Algorithms for extracting density profiles are outlined in the case of uncontrolled reflection and controlled reflection of the cyclotron radiation within the tokamak vacuum chamber.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01007065
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    Paper (German National Licenses)
    Fulltext
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