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A determination of the absolute values and signs of the 111 and 222 structure factors of silicon (1974)

Ando, Y. ; Ichimiya, A. ; Uyeda, R.

[S.l.] : International Union of Crystallography (IUCr)

Acta crystallographica 30 (1974), S. 600-601

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ISSN: 1600-5724

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Chemie und Pharmazie , Geologie und Paläontologie , Physik

Notizen: The thickness fringes of a silicon wedge at the Bragg positions for 111 and 222, and at the symmetric position for hhh were observed with the electron microscope at 100 and 392 kV. The ratios of the measured fringe distances were analysed by the many-beam dynamical theory in electron diffraction assuming the theoretical values for the structure factors of orders higher than 333. As the result, the crystal structure factors are derived as F111 = 59.87 ± 0.46 and F222 = - 1.85 ± 0.85 at 293 °K.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S0567739474001409

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Digitale Medien

An anomalous beam observed in X-ray diffraction topographs (1970)

Ando, Y.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 3 (1970), S. 404-405

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ISSN: 1600-5767

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Geologie und Paläontologie , Physik

Notizen: In X-ray diffraction topographs for nearly perfect crystals including a local heavy distortion, an anomalous beam was sometimes observed outside the ordinary section topograph. Experimentally, it was confirmed that the beam is due to the Bragg reflection of Kα2 and continuous components included in the incident radiations.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S0021889870006520

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Digitale Medien

X-ray diffraction phenomena in elastically distorted crystals (1970)

Ando, Y. ; Kato, N.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 3 (1970), S. 74-89

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ISSN: 1600-5767

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Geologie und Paläontologie , Physik

Notizen: Diffraction phenomena in diametrically compressed single-crystal plates of silicon were systematically studied by topographic methods of the traverse and section types with Cu, Mo and Ag radiations. Black and white contrasts in the traverse topographs depend on the magnitude of the strain gradient, absorption, the sign and the order of the reflection vector, and the crystallographic orientations of the specimens. The results were interpreted in terms of the diffraction theory for a constant strain gradient. The distribution of the strain gradient was calculated under the assumptions of plane stress and isotropic elastic constants. Qualitative agreement was obtained between the theory and experiments. The behaviour of the contrast, including the departure from Friedel's law, is due to Borrmann absorption in distorted crystals. The quantitative discrepancy is explained by anisotropy of the elastic constants. The departure from a constant strain gradient is detectable by the asymmetry of the intensity distribution in section topographs.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S002188987000568X

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