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  • 1975-1979  (1)
  • SIMS  (1)
  • Limulus test
  • Sphingomyelinase
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  • 1
    Electronic Resource
    Electronic Resource
    Atomic mixing in ion probe microanalysis (1975)
    Springer
    Applied physics 6 (1975), S. 277-279 
    Details
    ISSN: 1432-0630
    Keywords: Surface analysis ; SIMS
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The atomic mixing due to a knock-on cascade has much influence on the depth resolution of ion probe microanalysis. The preliminary experimental results support the assumption that the depth resolution due to this effect is determined by the competition of sputtering rate and creation rate of atomic displacement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00883764
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