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The direct observation and investigation of the oxidation of aluminum in the transmission electron microscope (1979)

Csanády, Á. ; Barna, Á ; Barna, P. B.

Springer

Oxidation of metals 13 (1979), S. 245-254

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ISSN: 1573-4889

Keywords: high-purity aluminum thin films ; in situ electron microscopy ; in situ evaporation ; in situ oxidation

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics

Notes: Abstract The authors studied the oxidation of thin aluminum films free of oxide layers in situ prepared by evaporation directly in the electron microscope under ultra-high-vacuum conditions. The oxidation was realized at various temperatures (350–500°C) and at various oxygen pressures (1–10−3 Pa). The formation and growth of the amorphous and crystalline products have been studied.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00603669

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