ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The structure and orientation of MnBi thin films prepared by sequential evaporation of bismuth and manganese on glass substrates were studied by transmission electron microscopy and electron diffraction. Results indicate that these films develop a preferred orientation with thec-axis perpendicular to the film plane. This preferred orientation is due to the formation of MnBi from a highly oriented bismuth layer, i.e., a layer with thec-axis perpendicular to the film plane. Trace amounts of elemental bismuth, manganese and MnO are found in these MnBi films. There is evidence of close parallel alignment between the MnBi and the bismuth lattices.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00761954
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