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  • Chemistry  (19)
  • 25.40.-h  (1)
  • Angiosarcoma  (1)
  • 1
    ISSN: 1432-1440
    Keywords: Angiosarcoma ; Heart tumor ; Hemangiosarcoma
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract This report describes a 26-year-old patient with hemangiosarcoma of the heart and summarizes the clinicopathological features in previous reports of patients with cardiac angiosarcoma. The patient was admitted to our hospital because of a syncope and one episode of nocturnal dyspnea and hemoptysis. In his history he complained of progressive weakness and loss of weight over the past 2 months. Echocardiography and computed tomography of the chest showed inhomogeneous masses in the pericardial cavity completely surrounding the heart and involving the ascending aorta and the superior vena cava. Histological examination of the tissue obtained from the mass by fine needle technique revealed a poorly differentiated malignant tumor of mesenchymal origin. Exploratory thoracotomy followed by tumor biopsies showed an inoperable cardiac hemangiosarcoma of enormous size with multiple metastases in both lungs. Palliative tumor resection was not performed. During the postoperative course the patient still required controlled ventilation. After 3 days of cytostatic chemotherapy no regression of tumor mass was seen by chest radiography. Cardiorespiratory insufficiency was progressive, and the patient died within 3 weeks after admission.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1434-601X
    Keywords: 25.40.-h ; 25.30.+ S ; 13.85.-t
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We have investigated kinematical correlations between the outgoing beam proton and the proton emerging from the fragmentingα-particle inpα collisions at $$\sqrt {s_{p\alpha } } = 88GeV$$ . Strong correlations are seen, indicating the dominance of quasi-elasticpp scattering in the fragmentation channelp+α→p+pX, for the ¦t¦ range 0.05–1.00 (GeV/c)2. A Monte Carlo simulation of this process can explain the observed correlation spectra assuming an admixture of about 16% spectator protons.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 25 (1994), S. 175-179 
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Investigation of Fundamental Properties and Tribological Behaviour of HfB2 and Hf(B,N) CoatingsThin films of HfB2 and Hf(B,N), including intermediate layers of pure titanium, were sputtered in a rf sputtering unit on steel substrates. The deposition parameters bias-voltage and deposition pressure in the case of HfB2 and the nitrogen flow concerning to Hf(B,N) were systematically varied. The characterization of the coatings includes fundamental properties such as thickness, hardness, adhesion and cohesion, structure, morphology, residual stresses and wear resistance of the coatings resulting from the plate on cylinder tribometer.The hardness values, analysed with the Vickers and the indentation depth method (Universal hardness), were extremely high for HfB2 films, deposited with low deposition pressure or high bias voltage applied on the substrate. These results are probably caused by high residual stresses in the coating. The best wear properties could be obtained by testing the hardest coatings.
    Notes: Dünne Schichten aus HfB2 und Hf(B,N) wurden mit einer Ti-Zwischenschicht in einer Hochfrequenz-Sputteranlage auf Stahlsubstrate aufgebracht. Dabei wurden die Beschichtungsparameter Bias-Spannung und Gasgesamtdruck im Fall von HfB2 so wie der Stickstoffluß bei Hf(B,N) systematisch variiert. Zur Charakterisierung der Schichtsysteme dienten die grundlegenden Eigenschaften Schichtdicke, Schichthärte, Haftfestigkeit, Kristallstruktur, Morphologie und Schichteigenspannungen sowie das Verhalten unter tribologischer Beanspruchung im Platte-Walze-Modellverschleißversuch.Die mit der vickers- und der Eindringtiefenmethode (Universalhärte) ermittelten Härtewerte waren besonders hoch bei HfB2- Schichten, die bei geringem Gasgesamtdruck oder hoher Bias-Spannung am Substrat abgeschieden wurden. Dies ist vermutlich auf die Eigenspannungen in den Schichten zurückzuführen. Die härtesten Schichten zeigten auch die besten Verschleißeigenschaften.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Materialwissenschaft und Werkstofftechnik 20 (1989), S. 271-277 
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Description / Table of Contents: Calculation of X-ray reflections of polycrystalline Titanium under the influence of a nitrogen gradient and residual stressesIn the present paper a procedure is shown for the calculation of x-ray reflections from a crystalline solid, in which a concentration gradient as well as planar surface residual stresses exist. The (004)-reflection of nitrided titanium with residual stresses serves as an example. The profiles and positions of the (004)-reflections are calculated for a residual stress measurement according to the ω-procedure.The calculated results show that a concentration gradient broadens the reflection profile while homogeneous residual stresses shift the position of the reflection. Since the position of the reflection is only negligibly altered by a concentration gradient, a separation of both influences from the analysis of the diffractogram is possible.
    Notes: In der vorliegenden Arbeit wird ein Verfahren zur Berechnung von Röntgenreflexen eines Festkörpers, in dem gleichzeitig ein Konzentrationsgradient und ebene oberflächenparallele Eigenspannungen vorhanden sind, vorgestellt. Als Beispiel dient der (004)-Reflex von nitriertem, eigenspannungsbehaftetem Titan. Die Profile und Lagen des (004)-Reflexes werden berechnet für eine Eigenspannungsmessung nach dem ω-Verfahren.Die erhaltenen Rechenergebnisse Zeigen, daß ein Konzentrationsgradient das Reflexprofil verbreitert, während homogene Eigenspannungen die Reflexlage verschieben. Die Reflexlage wird durch einen Konzentrationsgradienten in dem gewählten Stoffsystem nur vernachlässigbar beeinflußt, so daß eine Trennung beider Einflußgrößen aus der Diffraktogrammauswertung möglich ist.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 0933-5137
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 73 (1961), S. 707-707 
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 72 (1960), S. 778-778 
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 73 (1961), S. 492-493 
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 59 (1947), S. 155-157 
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für die chemische Industrie 65 (1953), S. 303-304 
    ISSN: 0044-8249
    Keywords: Chemistry ; General Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
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