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  • 32.80-t  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Photoelectron study of the 4d subshell of atomic tin between 35 and 115 eV (1986)
    Springer
    The European physical journal 2 (1986), S. 123-126 
    Details
    ISSN: 1434-6079
    Keywords: 32.80-t
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Partial cross sections σ and angular distribution parameters β have been measured for the 4d electrons of atomic tin between 35 and 115 eV. Our data for tin (Z=50) are compared with relativistic-random phase approximation (RRPA) calculations on the closed-shell atom cadmium (Z=48). Satisfactory agreement is found if the results are normalized to the same photoelectron energy. Comparison with RRPA calculations made for palladium (Z=46) and xenon (Z=54) reveals some differences. Other experimental data for the β parameter are in good agreement with our values.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01438233
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