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Photoelectron study of the 4d subshell of atomic tin between 35 and 115 eV (1986)

Gerard, P. ; Krause, M. O. ; Carlson, T. A.

Springer

The European physical journal 2 (1986), S. 123-126

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Details

ISSN: 1434-6079

Schlagwort(e): 32.80-t

Quelle: Springer Online Journal Archives 1860-2000

Thema: Physik

Notizen: Abstract Partial cross sections σ and angular distribution parameters β have been measured for the 4d electrons of atomic tin between 35 and 115 eV. Our data for tin (Z=50) are compared with relativistic-random phase approximation (RRPA) calculations on the closed-shell atom cadmium (Z=48). Satisfactory agreement is found if the results are normalized to the same photoelectron energy. Comparison with RRPA calculations made for palladium (Z=46) and xenon (Z=54) reveals some differences. Other experimental data for the β parameter are in good agreement with our values.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF01438233

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