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Digitale Medien

Attachment kinetics and life time of perionization electrons in rate-gas halogen laser mixtures (1986)

Lin, Shao-Chi ; Zheng, Cheng-En ; Lo, Dennis ; [weitere]

Springer

Applied physics 40 (1986), S. 15-23

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Details

ISSN: 1432-0649

Schlagwort(e): 34.80G ; 42.55 ; 52.80

Quelle: Springer Online Journal Archives 1860-2000

Thema: Physik

Notizen: Abstract Experiments on homogeneous initiation of pulsed avalanche discharges in typical XeCl laser mixtures show that the x-ray preionization pulse remains effective after a time delay of the order of 20 μs even at very high gas pressures (∼15 atm). Detailed kinetics analyses indicate that dissociative attachment of HCl is relatively slow during and after the preionization period so that the long effective delay time cannot be attributed to the storage effect of Cl− ions. Instead, the observed phenomenon can be attributed to the long survival time of the free electrons due to relatively slow diffusion and electron-ion recombination. Some problems arising from quantitative interpretation of the experimental results are also noted and discussed.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF00697222

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