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  • 61.10  (2)
  • Calcium uptake  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Experimental brain research 80 (1990), S. 252-259 
    ISSN: 1432-1106
    Keywords: Calcium uptake ; NMDA receptor ; Striate cortex ; Deprivation ; Kitten ; Synoptic plasticity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary As a functional measure of NMDA receptor effectiveness in kitten striate cortex, the uptake of 45Ca by visual cortical slices was measured after 2 minute bath applications of N-methyl-d-aspartate (NMDA). Significant Ca uptake occured in response to 12.5–100 μM NMDA in slices prepared from visual cortex of normal animals aged 28–48 days. Basal uptake (in the absence of NMDA) was increased and evoked uptake was decreased in visual cortical slices prepared from age-matched dark-reared animals. Four days of binocular deprivation in otherwise normally reared animals had no effect on basal uptake, but significantly lowered NMDAevoked Ca uptake at agonist concentrations greater than 25 μM. These data suggest that even brief manipulations of sensory experience are sufficient to alter visual cortical calcium regulation.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 95 (1994), S. 331-339 
    ISSN: 1434-6036
    Keywords: 68.15 ; 61.10 ; 68.10
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The complete wetting of an uncoated silicon wafer covered with a native oxide layer by saturated vapour of carbon tetrachloride was studied by using the x-ray reflectivity-technique. Differential heating of the substrate relative to a liquid reservoir was used to examine the disjoining pressure as a function of film thickness. The measurements were done at the temperaturesT=308K andT=318K of the reservoir. The observed film thicknesses varied between 26Å and 345Å depending on the temperature difference. A model for explaining the measured film thickness as a function of the temperature difference in terms of van der Waals forces is presented. It is based on the non-retarded interaction and includes terms of higher order in the film thickness. Microscopic constants like the Hamaker constant were determined and compared with reported values.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 98 (1995), S. 89-95 
    ISSN: 1434-6036
    Keywords: 68.15 ; 61.10 ; 68.10
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract X-ray scattering experiments of liquid films on top of solid substrates were performed. With a short pulse disturbance, caused by a temperature difference between the substrate and the vapour in the X-ray cell, the wetting film thickness is reduced. Afterwards the time dependence of the growing film is monitored by X-ray reflectivity measurements in the region of total external reflection. We have examined CCl4- and CCl3Br-films on top of silicon wafers and CCl3Br on glass/gold and glass/silver substrates. The film thickness as function of time is explained by the Kolmogorov growth model. From the data we obtain rather long time constants and the dimensiond=2 of the growing process
    Type of Medium: Electronic Resource
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