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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 63 (1996), S. 277-281 
    ISSN: 1432-0630
    Keywords: 68.35.-p ; 79.60.-i
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Interfacial reactions of evaporated chromium with $$Al_2 O_3 (1\bar 102)$$ surface has been studied using Auger electron spectroscopy (AES). The results reveal that the interfacial region consists of a mixture, which is a double oxide of Cr and Al or two separated oxides. After annealing, the chromium oxide and the metallic Al produced by reduction of the Al3+ ions were easily detected by AES at the interface. We suggest that the interfacial reaction occurs mainly by the charge transfer from the 3d electrons of Cr atoms to O 2p orbitals of the Al2O3 substrate. The annealing at higher temperature (≈973 K) is favourable to promote the interfacial reaction between the surface oxygen and the initial few atomic monolayers of the deposited chromium. The results also showed that the change of the relative Auger peak-to-peak height (APPH(%)) of the Cr LMM group peaks can be used as an index to identify the oxidation states of chromium at the Cr/Al2O3 interface.
    Type of Medium: Electronic Resource
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