ISSN:
1432-0630
Keywords:
61.70.Ng
;
68.35.p
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract A recently proposed technique for preparing, in a very simple way, thin film tilt grain boundaries is described and analyzed. Some electron microscopy characterization of the bicrystals is presented and a comparison between this new method and some of the standard techniques is made from a critical point of view. Some new applications of grain boundary research using this technique are also proposed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00615507
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