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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 56 (1993), S. 119-122 
    ISSN: 1432-0630
    Keywords: 74.70 ; 73.60 ; 68.55
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A method (laser raster microscopy with thermal excitation, LRMTE) for characterizing high-T c thin-film superconductors (HTSC) with microscopic resolution is described. By means of spatially resolved laser excitation and subsequent monitoring of the time dependence of the film resistivity at a base temperature near the transition temperature T c, spatial variations of the transition temperature (T c), of the temperature coefficient of the resistivity (dQ/dT), of the heat conductivity and heat capacity of the film and of the heat conductivity between film and substrate can be detected with high spatial resolution (15 μm have been achieved so far).
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0630
    Keywords: 73.60.K ; 81.15.E ; 81.40.G
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Y1Ba2Cu3O7−δ thin films were deposited by KrF laser ablation while replacing conventional contact heating by cw CO2 laser irradiation of the substrate front surface. The HTSC films obtained on (100)ZrO2 showed T c(R=0)=90 K, ΔT(90–10%)=0.5 K, j c=2.5 × 106 A/cm2, a sharp transition in the ac susceptibility X(T), and pure c-axis orientation. Micrographs of thin films (〈 0.5 μm) showed a smooth morphology while thick films (〉1 μm) contained many crystallites sticking in the bulk material. Furthermore, in situ patterning was achieved during deposition by local laser heating of a selected substrate surface area. The resulting planar films contained amorphous, semiconducting parts only 1 mm or less apart from crystalline material showing the above HTSC quality.
    Type of Medium: Electronic Resource
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