ISSN:
1432-0630
Keywords:
75.70Ak
;
73.60Aq
;
75.30Pd
;
79.60Cn
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract The thickness dependence of the magnetic band structure of ultrathin, epitaxial Ni(111)/W(110) layers has been studied by spin and angle-resolved photoemission spectroscopy. The changes of the spin-resolved photoemission intensities upon reducing the layer thickness depend strongly on the wavevector along the Γ-L line of the Brillouin zone. The measured exchange splittingΔ atk ≃1/3(Γ-L) andk ≃1/2(Γ-L) is found to be independent of the layer thickness for layers consisting of 3 or more atomic layers, whileΔ decreases rapidly with the layer thickness atk≃2/3(Γ-L). This behavior is very similar to the temperature dependence of the spin-resolved photoemission spectra of bulk Ni(111) at the samek-points.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00616982
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