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  • 74.72 Bk  (1)
  • 75.10.Hk  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    JETP letters 67 (1998), S. 584-588 
    ISSN: 1090-6487
    Keywords: 75.30.Cr ; 75.60.Ej ; 75.10.Hk
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We have performed measurements of the magnetization and differential magnetic susceptibility of Dy0.62Y2.38Fe5O12 single crystals in pulsed magnetic fields up to 45 T at liquid-helium temperature for three orientations of the external field: H‖[100], H‖[110], and H‖[111]. It was found that the magnetization reversal in the rare-earth magnetic subsystem occurs via several phase transitions, whose number depends on the direction of the external field, as is characteristic for Ising magnets. The anomalies in the field dependences of the magnetization are interpreted on the assumption of quasi-Ising ordering of the rare-earth ions.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1573-7357
    Keywords: 74.72 Bk ; 74.60 Jg ; 74.60 Ge
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The understanding of flux jumps in the high temperature superconductors is of importance since the occurrence of these jumps may limit the perspectives of the practical use of these materials. In this work we present the experimental study of the role of heavy ion irradiation in stabilizing the HTSC against flux jumps by comparing un-irradiated and 7.5 · 1010 Kr-ion/cm2 irradiated (YxTm1−x)Ba2Cu3O7 single crystals. Using pulsed field magnetization measurements, we have applied broad range of field sweep rates from 0.1T/s up to 1800 T/s to investigate the behavior of the flux jumps. The observed flux jumps, which may be attributed to thermal instabilities, are incomplete and have different amplitudes. The flux jumps strongly depend on the magnetic field, on the magneto-thermal history of the sample, on the magnetic field sweep rate, on the critical current density jc, on the temperature and on the thermal contact with the bath in which the sample is immersed.
    Type of Medium: Electronic Resource
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